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NIST Authors in Bold

Displaying 44976 - 45000 of 73697

Comparison of Two Cryogenic Radiometers at NIST

August 1, 2001
Author(s)
Jeanne M. Houston, David J. Livigni
Two cryogenic radiometers from NIST, one from the Optical Technology Division and the other from the Optoelectronics Division, were compared at three visible laser wavelengths. For this comparison each radiometer calibrated two photodiode trap detectors

Definitions of the Units Radian, Neper, Bel, and Decibel

August 1, 2001
Author(s)
I M. Mills, Barry Taylor, A J. Thor
The definition of coherent derived units in the International System of Units (SI) is reviewed, and the important role of the equations defining physical quantities is emphasized in obtaining coherent derived units. In the case of the dimensionless

Design of an Active MM-Wave Concealed Object Imaging System

August 1, 2001
Author(s)
Nicholas Paulter, Erich N. Grossman, Gerard N. Stenbakken, Bryan C. Waltrip, Shalva Nolen, Carl D. Reintsema
The research and design of an active millimeter-wave concealed object imaging system is described. Several illumination and detection methods were analyzed via computer simulation to assess the effects of system parameters on the signal-to-noise ratio of

Domain-Engineered Thin-Film LiNbO 3 Pyroelectric-Bicell Optical Detector

August 1, 2001
Author(s)
John H. Lehman, A. M. Radojevic, R M. Osgood
We have fabricated a bicell detector consisting of a single freestanding 10 um thick film of single-crystal lithium niobate (LiNbO3), having two adjacent domains of opposite spontaneous polarization, and hence two adjacent pyroelectric detector regions of

Early Stage Crystallization in Poly (Ethylene-Co-Hexene) by SAXS/WAXD, DSC, OM and AFM

August 1, 2001
Author(s)
G Z. Wang, Haonan Wang, K Shimizu, Charles C. Han, B S. Hsiao
Isothermal crystallization in the early stages of one short-chain branching polyethylene, PEH, is examined by time-resolved SAXS/WAXD, DSC, optical microscope and AFM. WAXD showed a rapid decrease of the inter-chain distance in the amorphous phase at the

Edge Determination for Polycrystalline Silicon Lines on Gate Oxide

August 1, 2001
Author(s)
John S. Villarrubia, Andras Vladar, J R. Lowney, Michael T. Postek
In a scanning electron microscope (SEM) top-down secondary electron image, areas within a few tens of nanometers of the line edges arc characteristically brighter than the rest of the image. In general, the shape of the secondary electron signal within

Electric Force Microscopy with a Single Carbon Nanotube Tip

August 1, 2001
Author(s)
John A. Dagata, F S. Chien, S Gwo, K Morimoto, T Inoue, J Itoh, H Yokoyama
Carbon nanotube tips offer a significant improvement over standard scanned probe microscope (SPM) tips for electrical characterization of nanodevice structures. Carbon nanotube tips are compatible with requirements for integrated SPM probe station

Electrochemical Properties of Nanocrystalline Cadmium Stannate Films

August 1, 2001
Author(s)
Gintaras Valincius, Vytas Reipa, V L. Vilker, John T. Woodward IV, Mark D. Vaudin
Electrochemical properties of the sol-gel nanocrystalline cadmium tin oxide electrodes (CTO) were investigated in 0.2 M potassium chloride buffered at pH 7.4 with phosphate. Films were found to be n-type degenerate semiconductors with charge carrier levels

Electronic Display Metrology--Not a Simple Matter

August 1, 2001
Author(s)
Edward F. Kelley
Most would assume that the characterization of electronic display quality would be a straightforward process offering few complications. However, what the eye sees can be very difficult to capture accurately and quickly in a meaningful way. With the advent

Elimation of Intensity Noise at SURF III

August 1, 2001
Author(s)
Uwe Arp, K Harkay, K Kim, Thomas B. Lucatorto
Most applications of synchrotron radiation are not very sensitive to source intensity fluctuations. Fourier-transform spectroscopy, however, is very sensitive to intensity noise with frequencies of few Hz to several kHz. An infrared spectrometer installed
Displaying 44976 - 45000 of 73697
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