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Displaying 41201 - 41225 of 74207

Toward Traceability for At-line AFM Dimensional Metrology

July 1, 2003
Author(s)
Marylyn H. Bennett, Angela Guerry, Ronald G. Dixson, Michael T. Postek, Theodore V. Vorburger
The in-line and at-line measurement tools for critical dimension (CD) metrology in semiconductor manufacturing are technologically advanced instruments that exhibit excellent measurement repeatability - below one nanometer in some cases. Accuracy, however

Towards High Accuracy Reflectometry for Extreme-Ultraviolet Lithography

July 1, 2003
Author(s)
Charles S. Tarrio, S Grantham, M B. Squires, Robert E. Vest, Thomas B. Lucatorto
Currently the most demanding application of extreme ultraviolet optics is connected with the development of extreme ultraviolet lithography. Not only does each of the Mo/Si multilayer EUV stepper mirrors require the highest attainable reflectivity at 13 nm

Two-Color Photoassociation Spectroscopy of the Lowest Triplet Potential of Na 2

July 1, 2003
Author(s)
L E. de Araujo, J D. Weinstein, S D. Gensemer, F K. Fatemi, Kevin Jones, Paul D. Lett, Eite Tiesinga
We have performed a type of Autler-Townes spectroscopy to locate a number of rovibrational hyperfine levels of the a ^3^ς + u potential, the lowest triplet potential of the Na 2 dimer. The spectroscopy starts with the photoassociation of ultracold atoms in

UML 2 Activity and Action Models

July 1, 2003
Author(s)
Conrad E. Bock
This is the first in a series introducing the activity model in the Unified Modeling Language, version 2 (UML 2), and how it integrates with the action model [1]. The series is a companion to the standard, providing additional background, rationale

Virtual Environment for Manipulating Microscopic Particles with Optical Tweezer

July 1, 2003
Author(s)
Thomas W. LeBrun, Kevin W. Lyons, Yong-Gu Lee
In this paper, we use virtual reality techniques to define an intuitive interface to a nanoscale manipulation device. This device utilizes optical methods to focus laser light to trap and reposition nano-to-microscopic particles. The underlying physics are

Data Evaluation Theory and Practice for Materials Properties

June 26, 2003
Author(s)
R G. Munro
Data evaluation is the process by which collections of data are assessed with respect to reliability, completeness, and consistency. The present work addresses data evaluation for materials properties as a scientific discipline that evolves from the formal

Magneto-optic effects in spin-injection devices

June 23, 2003
Author(s)
Steve Ruggiero, Anthony Williams, Carol Tanner, S. Potashnik, John M. Moreland, William Rippard
The magneto-optic properties of semi-transparent ferromagnetic films are presented in the context of ferromagnet/GaAs spin-injection devices. We have measured the polarization-dependent photoresponse and magneto-optic properties of Co/i}n-GaAs, Co/p-GaAs

Direct Observation of De-Mixing in a Ceramic Metal-Halide Arc Lamp

June 18, 2003
Author(s)
John J. Curry, H G. Adler, S Shastri, W -. Lee
De-mixing of additives in a vertically-operated DyI 3-CsI-Hg ceramic metal halide arc lamp has been observed by examining the ratios of absolute elemental densities as a function of position. As the elemental densities have been obtained directly by x-ray

Durability Gap Analysis for Fiber-Reinforced Polymer Composites in Civil Infrastructure

June 18, 2003
Author(s)
V M. Karbhari, Donald L. Hunston, B Benmokrane, T Juska, Roy S. Morgan, J Lesko, U Sorathia, D R. Reynaud
The lack of a comprehensive, validated, and easily accessible data base for the durability of fiber-reinforced polymer _FRP_composites as related to civil infrastructure applications has been identified as a critical barrier to widespread acceptance of

Morphotropic Phase Boundary Perovskites, High Strain Piezoelectrics, and Dielectric Ceramics

June 18, 2003
Author(s)
R Guo, Winnie Wong-Ng, D Viehland, C M. Wu, K M. Nair, A S. Bhalla, D Suvorov, S I. Hirano
The content of this Ceramic Transactions volume comprises the proceedings of the Symposium on Dielectric Materials andMultilayer Electronic Devices and the Symposium on Morphotropic Phase Boundary Phenomena and Perovskite Materials,held April 28 - May 1

Velocity Fluctuations in a Steadily Sheared Model Foam

June 18, 2003
Author(s)
I K. Ono, S Tewari, Stephen A. Langer, A J. Liu
Numerical simulations are conducted to calculate velocity fluctuations in a simple two-dimensional model of foam under steady shear. The width of the velocity distribution increases sublinearly with the shear rate, indicating that velocity fluctuations are

An Optimal Multiline TRL Calibration Algorithm

June 17, 2003
Author(s)
Dylan Williams, Jack Wang, Uwe Arz
We examine the performance of two on-wafer multiline TRL calibration algorithms, the popular multiline TRL algorithm implemented in the MultiCal software package and a newly implemented iterative algorithm designed to give optimal results in the presence

Development of a Quantum Based Microwave Power Measurement

June 17, 2003
Author(s)
Thomas P. Crowley, E. A. Donley, T P. Heavner, John R. Juroshek, Billy F. Riddle
An initial proof-of-concept experiment to measure microwave power based on quantum-mechanical principles is presented. Rabi oscillations between two hyperfine levels of the cesium ground state are measured and used to determine the RF magnetic field

Extraction of Conversion Matrices for P-HEMTs based on Vectorial Large-Signal Measurements

June 17, 2003
Author(s)
Alessandro Cidronali, Kuldip Gupta, Jeffrey Jargon, Kate Remley, Donald C. DeGroot, Gianfranco Manes
This paper introduces a new technique which allows us to measure the admittance conversion matrix of a two-port device, using a large signal vector network analyzer. This method is applied to extract the conversion matrix of a 0.25 um PHEMT, driven by a 4

Multisine Excitation for ACPR Measurements

June 17, 2003
Author(s)
Catherine A. Remley
We use a simlator to compare ACPR measurements of a nonlinear device excited with various multisine signals to ACPR measurements of the same device excited with a QPSK-modulated pseudorandom digital signal. We examine four common types of multisine

Sampling Oscilloscope Models and Calibrations

June 17, 2003
Author(s)
Kate Remley, Dylan Williams
We discuss the basic principles of operation of electrical sampling oscilloscopes and describe circuit models developed to design, characterize, and help explain their operation. We survey common oscilloscope calibration schemes that correct for finite
Displaying 41201 - 41225 of 74207
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