U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 39051 - 39075 of 73830

Selecting Information Technology Security Products

April 28, 2004
Author(s)
Shirley M. Radack
This bulletin summarizes NIST Special Publication 800-36, "Guide to Selecting Information Technology Security Products." The selection of IT security products is an integral part of the design, development and maintenance of an IT security infrastructure

Visible, EUV, and X-Ray Spectroscopy at the NIST EBIT Facility

April 24, 2004
Author(s)
John D. Gillaspy, B Blagojevic, Paul A. Dalgarno, K Fahey, V Kharchenko, J M. Laming, L Logosi, E-O Le Bigot, K Makonyi, L P. Ratliff, E Silver, H. Schnopper, E Takacs, J N. Tan, H Tawara, K Tokesi
After a brief introduction to the NIST EBIT facility, we present the results of three different types of experiments that have been carried out there recently: EUV and visible spectroscopy in support of the microelectronics industry, laboratory

Tool Length-Dependent Stability Surfaces

April 20, 2004
Author(s)
T L. Schmitz, J C. Ziegert, Timothy J. Burns, Brian S. Dutterer, W R. Winfough
This paper describes the development of three-dimensional stability surfaces, or maps, that combine the traditional dependence of allowable (chatter-free) chip width on spindle speed with the inherent dependence on tool overhang length, due to the

Design of Occupant Egress Systems for Tall Buildings

April 19, 2004
Author(s)
Erica D. Kuligowski, Richard W. Bukowski
This paper presents an overview of current work and a discussion of the features of protected elevator systems that can provide safe and reliable operation both for fire service access and for occupant egress during fires. These features include water

Studies of Biometric Fusion Executive Summary

April 19, 2004
Author(s)
Craig I. Watson, Brad Ulery, R. A. Hicklin, William Fellner, P Halinan
This is an evaluation of different score-level fusion techniques, and the results of a variety of fusion experiments using face and fingerprint data from 187,000 individuals, with matcher scores from three fingerprint and three face recognition systems

Specifying Autonomy Levels for Unmanned Systems: Interim Report

April 16, 2004
Author(s)
Hui-Min Huang, James S. Albus, Elena R. Messina, R C. Wade, W English
The viability of Unmanned Systems as tools is increasingly recognized in many domains. As technology advances, the autonomy on board these systems also advances. In order to evaluate the systems in terms of their levels of autonomy, it is critical to have

Common Biometric Exchange File Format (CBEFF), Augmented

April 15, 2004
Author(s)
Fernando L. Podio, J S. Dunn, L Reinert, C J. Tilton, L O'Gorman, P Collier, Mark Jerde, B Wirtz
This report is an augmentation of the original standard, which was published as NISTIR 6529 (January 2001). Common Biometric Exchange File Format (CBEFF) describes a set of data elements necessary to support biometric technologies in a common way. These

Fingerprint Image Quality

April 13, 2004
Author(s)
Elham Tabassi, Charles Wilson, Craig I. Watson
In this report, we propose a new definition of quality of fingerprint impressions and present detailed algorithms to measure image quality for fingerprints. We define fingerprint image quality as a predictor of matcher performance before a matcher

Performance Evaluation Facility for LADARs

April 12, 2004
Author(s)
Geraldine S. Cheok, William C. Stone
The use and scope of LADAR (laser detection and ranging) applications continues to expand as the technology matures. This growth is reflected in the National Institute of Standards and Technology s (NIST) experience with research into the applications of

Reliability Metrology for the Semiconductor Industry at NIST

April 10, 2004
Author(s)
Stephen Knight, John S. Suehle, Joaquin (. Martinez
The National Institute of Standards and Technology provides critical metrology development for the semiconductor manufacturing industry as it moves from the microelectronics era into the nanoelectronics era. This presentation will describe the National

Structure and Reaction in the Active Site of Mammalian Adenylyl Cyclase

April 8, 2004
Author(s)
Y. S. Lee, Morris Krauss
The reaction path for the catalytic conversion of adenosine triphosphate (ATP) to cyclic adenosine monophosphate (cAMP) by the enzyme mammalian adenylyl cyclase has been calculated theoretically using the Hartree-Fock method. The crystal structure of a

Photomask Critical Dimension Metrology in the Scanning Electron Microscope

April 7, 2004
Author(s)
Michael T. Postek
Critical Dimension (CD) control begins at the photomask. Therefore, photomask metrology is a principal enabler for the development and manufacture of current and future generations of semiconductor devices. With the potential of 100, 65 and 45 nanometer

Microfabricated alkali atom vapor cells

April 5, 2004
Author(s)
Li-Anne Liew, Svenja A. Knappe, John M. Moreland, Hugh Robinson, David C. Larbalestier, John Kitching
We describe the fabrication of chip-sized alkali atom vapor cells using silicon micromachining and anodic bonding technology. Such cells may find use in highly miniaturized atomic frequency references or magnetometers. The cells consist of cavities etched

2nd Annual PKI Research Workshop Proceedings

April 1, 2004
Author(s)
Carl M. Ellison, William Polk, Nelson Hastings, Sean W. Smith
NIST hosted the second annual Public Key Infrastructure (PKI) Research Workshop on April 28-29, 2003. The two-day event brought together PKI experts from academia, industry, and government to explore the remaining challenges in deploying public key

A Dielectric Slit Die for In-Line Monitoring of Polymer Compounding

April 1, 2004
Author(s)
Anthony J. Bur, S C. Roth, M M. McBrearty
The dielectric slit die is an instrument that is designed to measure electrical, rheological, ultrasonics, optical and other properties of a flowing liquid. In one application it is connected to the exit of an extrudder, pump or mixing machine that passes

A digitally programmable capacitance standard

April 1, 2004
Author(s)
Yicheng Wang, Lai H. Lee
We constructed a digitally programmable capacitance standard by modifying a commercial temperature-stabilized 100 pF capacitance standard which consists of 23 binary-weighted capacitor elements on a single fused-silica disk. The variable capacitor can be

An Architecture for Modeling and Simulation for Emergency Response

April 1, 2004
Author(s)
Sanjay Jain, Charles R. McLean
A number of modeling and simulation applications exist for studying individual aspects of emergency response scenarios. The value of these applications can be significantly increased if they can be used in an integrated manner to study all aspects of a
Displaying 39051 - 39075 of 73830
Was this page helpful?