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Search Publications

NIST Authors in Bold

Displaying 39076 - 39100 of 73697

Energy Analysis of Multi-Lens Adhesion Measurements

March 1, 2004
Author(s)
Aaron M. Forster, Christopher Stafford, Alamgir Karim
The NIST Combinatorial Methods Center (NCMC) has adapted the Johnson Kendall, and Roberts (JKR) adhesive contact test for the development of a high-throughput adhesion measurement platform. This technique utilizes an array of hemispherical lenses to

Federal Information Processing Standard (FIPS) 199, Standards for Security

March 1, 2004
Author(s)
Shirley M. Radack
This ITL Bulletin describes FIPS 199, Standards for Security Categorization of Federal Information and Information Systems, which is an important component of a suite of standards and guidelines that NIST is developing to improve the security in federal

Finite-Size Effects on Surface Segregation in Polymer Blend Films Above and Below the Critical Point of Phase Separation

March 1, 2004
Author(s)
H Grull, Li Piin Sung, Alamgir Karim, Jack F. Douglas, Sushil K. Satija, Makoto Hayashi, H Jinnai, TT Hashimoto, Charles C. Han
We investigate the influence of temperature and confinement on surface segregation in thin films of deuterated polybutadiene and polyisoprene near the critical point for phase separation. Neutron reflectivity measurements show that polyisoprene enriches at

Flow Simulation of a Microfluidic Analog of the Four-Roll Mill

March 1, 2004
Author(s)
Frederick R. Phelan Jr., Steven Hudson
The fluid dynamics of channel geometries for liquid state materials characterization in microfluidic devices are investigated using finite element flow simulation and flow classification criteria. A pressure driven microchannel device is sought that has an

Fracture Mirrors in a Nanoscale 3Y-TZP

March 1, 2004
Author(s)
George D. Quinn, J Eichler, U Eisele, J Rodel
The strengths of fine microstructural scale yttria stabilized rectangular bars and circular disks were measured by four-point flexure and by flat ball (piston) on three ball methods. Fracture mirror sizes were measured and correlated to the strengths

In Depth Observational Studies of Professional Intelligence Analysts

March 1, 2004
Author(s)
Jean C. Scholtz, Emile L. Morse
Our goal is to produce metrics for measuring effectiveness of software tools and environments produced for the intelligence community. To this end we need to understand the analytic process and to determine which data need to be captured to meaningfully

Influence of Grain Size on the Tensile Creep Behavior of Ytterbium-Containing Silicon Nitride

March 1, 2004
Author(s)
Sheldon M. Wiederhorn, A R D Lopez, William E. Luecke, Michael J. Hoffmann, B Hockey, J French, D C. Yoon
The effect of grain size on the tensile creep of silicon nitride is investigated on two materials, one containing 5 % by volume Yb2O3, the other containing 5 % by volume Yb203 and 0.5 % by mass Al2O3. Annealing of the alumina-free silicon nitride increased

Intramural comparison of NIST laser and optical fiber power calibrations

March 1, 2004
Author(s)
John H. Lehman, Igor Vayshenker, David J. Livigni, Joshua A. Hadler
The responsivity of two optical detectors was determined by the method of direct substitution in four different NIST measurement facilities. The measurements were intended to demonstrate the determination of absolute responsivity as provided by NIST

MALDI of Layered Polymer Films

March 1, 2004
Author(s)
Barry J. Bauer, Kathleen M. Flynn, B D. Vogt
A layered preparation method is introduced that produces structured MALDI targets with well-defined phase sizes and compositions. Tri-a-naphthyl benzene is a glassy matrix that forms smooth films. It is layered with polystyrenes or polyethylene glycol

Nano-Lithography in Ultra-High Vacuum (UHV) for Real World Applications

March 1, 2004
Author(s)
James D. Gilsinn, Hui Zhou, Bradley N. Damazo, Joseph Fu, Richard M. Silver
As nano-lithography technology improves, more companies and research groups have the capability to create nano-scale structures. Scanning tunneling microscopes (STMs) are commonly used to create these structures and evaluate them afterward. One difficulty
Displaying 39076 - 39100 of 73697
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