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NIST Authors in Bold

Displaying 36851 - 36875 of 74165

Nanometer Gaps in Gold Wires Are Formed By Thermal Migration

June 7, 2005
Author(s)
Ganesh K. Ramachandran, Monica D. Edelstein, David L. Blackburn, John S. Suehle, Eric M. Vogel, Curt A. Richter
The formation of gold wires separated by a few nanometers is reported. Such nanometer separated gaps are formed by ramping, at ambient conditions, a bias voltage across a thin gold wire until the wire breaks or fails. Externally heating the wire does not

The Measurement of Optical Frequencies

June 7, 2005
Author(s)
Leo W. Hollberg, Scott A. Diddams, A Bartels, Tara M. Fortier, Kyoungsik Kim
Even the suggestion of counting optical frequencies in the visible (~ 500 THz) must have seemed ludicrous to many in the past, because traditional methods failed to work above about 100 GHz. Nonetheless, with some vision and new ideas a few researchers had

The NIST Kolsky Bar Data Processing System

June 7, 2005
Author(s)
Eric P. Whitenton
A new dynamic testing apparatus has been built at the National Institute of Standards and Technology (NIST) to measure dynamic material properties for machining simulation and other applications. This apparatus-the NIST Pulse Heated Kolsky Bar - is based

Electrical Properties of Nb-MoSi2-Nb Josephson Junctions

June 6, 2005
Author(s)
Yonuk Chong, Paul Dresselhaus, Samuel Benz
We present a detailed study of the electrical properties of planar Nb-MoSi2-Nb Josephson junctions. The Nb-MoSi2-Nb junction is an excellent system to study proximity-coupling in junctions with rigid superconductor/normal metal boundaries by controlling

A compact double-pass acousto-optic modulator system

June 1, 2005
Author(s)
Elizabeth A. Donley, Thomas P. Heavner, F Levi, M O. Tataw, Steven R. Jefferts
A problem that arises when using acousto-optic modulators (AOMs) to scan the laser frequency is the dependence of the beam diffraction angle on the modulation frequency. Alignment problems with AOM-modulated laser beams can be effectively eliminated by

A current-density scale for characterizing nonlinearity in high-Tc superconductors

June 1, 2005
Author(s)
Kenneth Leong, James C. Booth, Susan A. Schima
In this paper, we characterize microwave nonlinearity in a high temperature superconducting (HTS) thin film sample by measurement of a geometry-independent current-density scale j o. This quanity j specifies the strenth of a material-dependent nonlinearity

A Local Oscillator for Chip-Scale Atomic Clocks at NIST

June 1, 2005
Author(s)
Alan Brannon, J Breitbarth, Z Popovic, Vladislav Gerginov, V Shah, Svenja A. Knappe, Leo W. Hollberg, John E. Kitching
We report the first local oscillator (LO) demonstrating viability in terms of performance, size, and power, for chip scale atomic clocks (CSAC) at the National Institute of Standards and Technology in Boulder, CO. This volgate-controlled oscillator (VCO)

A Web Services Community Model for Services Provisioning

June 1, 2005
Author(s)
Z Luo, J Li, Jia Zhang
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

Active Light-Shift Stabilization in Modulated CPT Clocks

June 1, 2005
Author(s)
V Shah, P Schwindt, Vladislav Gerginov, Svenja A. Knappe, Leo W. Hollberg, John E. Kitching
We demonstrate a simple technique to significantly improve the long-term frequency stability in atomic clocks vased on coherent population trapping (CPT). In this technique an additional servo is used to control the local oscillator power level to ensure

Analysis of the Step-Diagonal Test

June 1, 2005
Author(s)
Johannes A. Soons
The step-diagonal test modifies the diagonal displacement test for machine tool performance evaluation by executing a diagonal as a sequence of single-axis motions. The proposed modification has gained interest because of the claim that the obtained

Analyzing Microstructure by Rietveld Refinement

June 1, 2005
Author(s)
Davor Balzar, N C. Popa
Rietveld refinement has a primary purpose of refining crystal structure. However, this powerful technique is being increasingly used for obtaining microstructural information, such as texture, crystallite size, strain and stress, and crystalline defect

Antenna coupled niobium bolometers for 10 (mu)m radiation detection

June 1, 2005
Author(s)
Robert Hadfield, Aaron J. Miller, Sae Woo Nam, Erich N. Grossman, Robert E. Schwall,
We report on the fabrication and testing of antenna-coupled niobium bolometers for 10-micron wavelength radiation detection. We use 20 nm thick Nb films on oxidized Si substrates. The bolometer design consists of a 1 micron x 1 micron Nb microbridge

Combinatorial and High-Throughput Measurement of the Modulus of Thin Polymer Films

June 1, 2005
Author(s)
Christopher M. Stafford, Shu Guo, Martin Y. Chiang, C Harrison
Considerable attention has been devoted to developing fabrication strategies for constructing combinatorial material libraries as well as tools for characterizing the chemical and physical properties of such libraries. Less attention has been dedicated to

Compressive Prestrain in High-Niobium-Fraction Nb 3 Sn Superconductors

June 1, 2005
Author(s)
John (Jack) W. Ekin, Najib Cheggour, Mike Abrecht, Cameron C. Clickner, Michael Field, Seungok Hong, Jeffrey Parrell, Y. Zhang
Multifilamentary Nb 3Sn superconducting strands fabricated with high niobium fractions have exceptionally high critical-current densities but are sometimes marginally stable during testing. We report a technique for determining the pre-strain in such
Displaying 36851 - 36875 of 74165
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