Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Combinatorial and High-Throughput Measurement of the Modulus of Thin Polymer Films



Christopher M. Stafford, Shu Guo, Martin Y. Chiang, C Harrison


Considerable attention has been devoted to developing fabrication strategies for constructing combinatorial material libraries as well as tools for characterizing the chemical and physical properties of such libraries. Less attention has been dedicated to designing high-throughput metrologies for probing the engineering properties of combinatorial libraries. Here, we describe the design and refinement in our high-throughput buckling-based metrology developed to ascertain the mechanical properties (e.g., modulus) of combinatorial thin film libraries. To illustrate the combinatorial and high-throughput capability of this metrology, thin films possessing a gradient in modulus were generated by stacking two polymer films of disparate moduli possessing gradients in film thickness. The local thickness and modulus ratios of each component in the composite film then dictate the measured modulus of the laminate film as a function of spatial position.
Review of Science Instruments
76 No 6


buckling, combinatorial, gradient, high-throughput, mechanical properties, mechanics, metrology, modulus


Stafford, C. , Guo, S. , Chiang, M. and Harrison, C. (2005), Combinatorial and High-Throughput Measurement of the Modulus of Thin Polymer Films, Review of Science Instruments, [online], (Accessed July 12, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created June 1, 2005, Updated February 19, 2017