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Phase-Sensitive Measurments of Nonlinearity in High Temperature Superconductor Thin Films at Variable Frquencies

Published

Author(s)

James Booth, Kenneth Leong, Susan A. Schima, Jeffrey Jargon, Donald C. DeGroot

Abstract

We present new frequency-dependent measurements of bothe the magnitude and phase of the nonlinear response in superconducting thin films at microwave frequencies. Our measurements show that the nonlinear inductance dominates the nonlinear response in thin YBCO filsm at 76K, and our analysis yields two current density scales corresponding to the real and imaginary components of the nonlinear response. The current density scale associated with the dominant inductive response likely results from intrinsic parir-breaking, while the current density scale associated with the nonlinear resistive term is smaller than the expected value due to pair-breaking, and could originate from vortex-motion or other extrinsic effects.
Proceedings Title
IEEE Transactions on Applied Superconductivity
Conference Dates
October 3-8, 2004
Conference Location
Jacksonville, FL, USA
Conference Title
Applied Superconductivity Conference

Citation

Booth, J. , Leong, K. , Schima, S. , Jargon, J. and DeGroot, D. (2005), Phase-Sensitive Measurments of Nonlinearity in High Temperature Superconductor Thin Films at Variable Frquencies, IEEE Transactions on Applied Superconductivity, Jacksonville, FL, USA (Accessed June 18, 2024)

Issues

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Created June 1, 2005, Updated October 12, 2021