Phase-Sensitive Measurments of Nonlinearity in High Temperature Superconductor Thin Films at Variable Frquencies

Published

June 2, 2005

Author(s)

James Booth, Kenneth Leong, Susan A. Schima, Jeffrey Jargon, Donald C. DeGroot

Abstract

We present new frequency-dependent measurements of bothe the magnitude and phase of the nonlinear response in superconducting thin films at microwave frequencies. Our measurements show that the nonlinear inductance dominates the nonlinear response in thin YBCO filsm at 76K, and our analysis yields two current density scales corresponding to the real and imaginary components of the nonlinear response. The current density scale associated with the dominant inductive response likely results from intrinsic parir-breaking, while the current density scale associated with the nonlinear resistive term is smaller than the expected value due to pair-breaking, and could originate from vortex-motion or other extrinsic effects.

Proceedings Title

IEEE Transactions on Applied Superconductivity

Conference Dates

October 3-8, 2004

Conference Location

Jacksonville, FL, USA

Conference Title

Applied Superconductivity Conference

Pub Type

Conferences

Citation

Booth, J. , Leong, K. , Schima, S. , Jargon, J. and DeGroot, D. (2005), Phase-Sensitive Measurments of Nonlinearity in High Temperature Superconductor Thin Films at Variable Frquencies, IEEE Transactions on Applied Superconductivity, Jacksonville, FL, USA (Accessed October 15, 2025)