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Analyzing Microstructure by Rietveld Refinement

Published

Author(s)

Davor Balzar, N C. Popa

Abstract

Rietveld refinement has a primary purpose of refining crystal structure. However, this powerful technique is being increasingly used for obtaining microstructural information, such as texture, crystallite size, strain and stress, and crystalline defect concentration. The review discusses determination of these properties in Rietveld-refinement programs with especial emphasis on the modeling of diffraction-line broadening and diffraction-line shift.
Citation
Rigaku J.

Keywords

crystallite size, diffraction, microstructure, Rietveld refinement, strain

Citation

Balzar, D. and Popa, N. (2005), Analyzing Microstructure by Rietveld Refinement, Rigaku J., [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50140 (Accessed July 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 2005, Updated October 12, 2021