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Displaying 35101 - 35125 of 74151

Comment on the Paper Metrologia 42 49-57 (2005) by K. Szymaniec et al,

February 1, 2006
Author(s)
Steven R. Jefferts, F Levi
A recent evaluation of the accuracy of National Physical Laboratory (NPL) primary frequency standard NPL CsF1 gives an overall frequency uncertainty of δŅ/Ņ 0 = 1 × 10 -15. This stated uncertainty includes a correction of a frequency bias of δŅ/Ņ 0 = 8 ×

Comparison between frequency standards in Europe and the USA at the 10 -15 uncertainty level

February 1, 2006
Author(s)
Joseph Achkar, Andreas Bauch, R Dach, R Hlavac, Luca Lorini, Thomas E. Parker, G. Petit, Dirk Piester, P Uhrich, K Szymaniec
Istituto Elettrotecnico Nazionale Galileo Ferraris (IEN), National Institute of Standards and Technology (NIST), National Physical Laboratory (NPL), Laboratoire National de Metrologie et de Essais?Observatoire de Paris/Systemes de Reference Temps Espace

Comparison of scanning capacitance microscopy and scanning Kelvin probe microscopy in determining two-dimensional doping profiles of Si homostructures

February 1, 2006
Author(s)
Seong-Eun Park, Nhan V. Nguyen, Joseph J. Kopanski, John S. Suehle, Eric M. Vogel
Two-dimensional (2-D) doping profiles of differently doped Si homostructures were investigated by scanning capacitance microscopy (SCM) and scanning Kelvin probe microscopy (SKPM). The calibrated doping concentration of the n-step Si layers was in the

Computer Security Division 2005 Annual Report

February 1, 2006
Author(s)
Tanya L. Brewer, Matthew A. Scholl
This report covers the work conducted within the National Institute of Standards and Technology's Computer Security Division during the Fiscal Year 2005. It discusses all projects and programs within the Division, staff highlights, and publications. For

Consistency of D 13 C Measurements Improved

February 1, 2006
Author(s)
T B. Copelen, W Brand, M Gehre, M Groening, HAJ Meijer, Blaza Toman, R. Michael Verkouteren
We present state-of-the-art measurements and data evaluation methods to show that the consistency of carbon isotope ratio measurements can be improved 39 % to 47 % by anchoring the measurement scale with two isotopic reference materials differing in carbon

Determination of Polybrominated Diphenyl Ethers in Indoor Dust Standard Reference Materials

February 1, 2006
Author(s)
H M. Stapleton, T. Harner, M. Shoeib, Jennifer M. Lynch, Michele M. Schantz, Stefan D. Leigh, Stephen A. Wise
Polybrominated diphenyl ethers (PBDEs) have been measured for the first time in three different indoor dust Standard Reference Materials (SRMs) prepared by the National Institute of Standards and Technology (NIST). Two of these SRMs (2583 and 2584) have

Energy Levels of 4f3 in the Free Nd3+ Ion From Emission Spectra

February 1, 2006
Author(s)
J-F Wyart, Ali Meftah, Annik Bachelier, Jocelyne Sinzelle, Wan-U Lydia Tchang-Brillet, Norbert Champion, Nissan Spector, J Sugar
The emission spectrum of neodymium produced by vacuum spark sources was observed in the vacuum ultraviolet on two normal-incidence spectrographs. In an initial result, more than 550 lines have been identified as transitions from 85 4f25d levels to 37

Generating Thickness Gradients of Thin Polymer Films via Flow Coating

February 1, 2006
Author(s)
Christopher Stafford, Kristen Roskov, Thomas Epps, Michael J. Fasolka
Thickness is a governing factor in the behavior of films and coatings. To enable the high-throughputanalysis of this parameter in polymer systems, we detail the design and operation of a flow coater device for fabricating continuous libraries of polymer

MEMS Length and Strain Round Robin Results with Uncertainty Analysis

February 1, 2006
Author(s)
Janet M. Cassard, Robert I. Scace, Winthrop A. Baylies
A microelectromechanical systems (MEMS) Length and Strain Round Robin Experiment was completed in January 2005 to compare results of in-plane length measurements, residual strain measurements, and strain gradient measurements at a number of laboratories
Displaying 35101 - 35125 of 74151
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