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NIST Authors in Bold

Displaying 33576 - 33600 of 73697

New Global Communication Process in Thermodynamics: Impact on Quality of Published Experimental Data

October 11, 2006
Author(s)
Michael D. Frenkel, Robert D. Chirico, Vladimir Diky, Chris D. Muzny, Qian Dong, K N. Marsh, John H. Dymond, William A. Wakeham, Stephen E. Stein, Erich Koenigsberger, Anthony R. Goodwin, Joe W. Magee, Michiel Thijssen, William M. Haynes, Suphat Watanasiri, Marco Satyro, Martin Schmidt, Andrew I. Johns, Gary R. Hardin
Thermodynamic data often represent a key resource in the search for new relationships between properties of chemical systems that constitutes the basis of the scientific discovery process. In addition, thermodynamic information is critical for development

Cationic Surfactants for the Control of Overfill Bumps in Cu Superfilling

October 10, 2006
Author(s)
Soo K. Kim, Daniel Josell, Thomas P. Moffat
Electroanalytical measurements and feature filling experiments have been conducted to study the effect of dodecyltrimethylammonium chloride (DTAC), a quaternary ammonium cationic surfactant, on Cu deposition in the presence of various combinations of

Determination of Levoglucosan in Particulate Matter Reference Materials

October 10, 2006
Author(s)
R Larsen, III, Michele M. Schantz, Stephen Wise
Source identification is critical for the effective management of air pollution. The ratio of levoglucosan (1,6-anhydro-B-D-glucose) to organic carbon has been used to identify and quantify the contribution of biomass combustion to the organic carbon

RF, Analog, and Mixed Signal Technologies for Communication ICs - An ITRS Perspective

October 10, 2006
Author(s)
Margaret Huang, Herbert S. Bennett, Julio Costa, Peter Cotrell, Anthony A. Immorlica, Jan-Erik Meuller, Charles E. Weitzel, Marco Racaneli, Hisashi Schichijo, Bin Zhao
The International Technology Roadmap for Semiconductor (ITRS) Radio Frequency and Analog/Mixed-Signal (RF and AMS) Wireless Technology Working Group (TWG) addresses device technologies for wireless communications covering both silicon-based and III-V

An Ontology of Identity Credentials Part 1: Background and Formulation

October 6, 2006
Author(s)
William I. MacGregor
The Information Technology Laboratory (ITL) at the National Institute of Standards and Technology (NIST) promotes the U.S. economy and public welfare by providing technical leadership for the Nation s measurement and standards infrastructure. ITL develops

Applications of a 3D Range Camera Towards Healthcare Mobility Aids

October 3, 2006
Author(s)
Roger V. Bostelman, Peter Russo, James S. Albus, Tsai Hong Hong, Rajmohan Madhavan
The National Institute of Standards and Technology (NIST) has recently studied a new 3D range camera for use on mobile robots. These robots have potential applications in manufacturing, healthcare and perhaps several other service related areas beyond the

CONTAM 2.4 User Guide and Program Documentation

October 3, 2006
Author(s)
George Walton, William S. Dols
This manual describes the computer program CONTAM version 2.3 developed by NIST. CONTAM is a multizone indoor air quality and ventilation analysis program designed to help you determine: airflows and pressures infiltration, exfiltration, and room-to-room

A Low-Threshold Self-Referenced Ti:Sapphire Optical Frequency Comb

October 2, 2006
Author(s)
Matthew S. Kirchner, Tara M. Fortier, A Bartels, Scott A. Diddams
We demonstrate an octave-spanning, self-referenced optical frequency comb produced with a high repetition rate (frep=585 MHz) femtosecond Ti:Sapphire laser that requires less that 1 W of 532 nm pump power. The frequency comb was stabilized to a CW laser as

Analysis of Hexabromocyclododecane Diastereomers and Enantiomers by Liquid Chromatography Tandem Mass Spectrometry: Chromatographic Selectivity and Ionization Matrix Effects

October 2, 2006
Author(s)
Nathan G. Dodder, Aaron Peck, John R. Kucklick, Lane C. Sander
Hexabromocyclododecane (HBCD) is a flame retardant that is undergoing environmental risk assessment. The liquid chromatographic retention and electrospray ionization matrix effects were investigated for HBCD methods of analysis for environmental matrices

Combinatorial Study of Ni-Ti-Pt Ternary Metal Gate Electrodes on HfO 2 for the Advanced Gate Stack

October 2, 2006
Author(s)
Kao-Shuo Chang, Martin L. Green, John S. Suehle, Eric M. Vogel, Hao Xiong, Jason Hattrick-Simpers, Ichiro Takeuchi, O Famodu, K Ohnaka, T Chikyow, Prashant Majhi, B H. Lee, M Gardner
We have fabricated combinatorial Ni-Ti-Pt ternary metal gate thin film libraries on HfO2 using magnetron co-sputtering, to investigate flat-band voltage shift (DVfb) and leakage current density (JL) variations. Wavelength dispersive spectroscopy (WDS)

COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS AS DETERMINED BY XRD AND EBSD

October 2, 2006
Author(s)
Jens Mueller, Davor Balzar, Roy H. Geiss, David T. Read, Robert Keller
Texture in materials has a large influence on many properties of thin films; it is customarily determined by neutron or X-ray diffraction by measuring pole figures and evaluating orientation-distribution functions (ODF). X-ray diffraction (XRD) was the
Displaying 33576 - 33600 of 73697
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