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Search Publications

NIST Authors in Bold

Displaying 27801 - 27825 of 73929

Composing complex EXAFS problems with severe information constraints

November 1, 2009
Author(s)
Bruce D. Ravel
In recent work, a model for the structural environment of Hg bound to a catalytic DNA sensor was proposed on the basis of EXAFS data analysis. Although severely constrained by limited data quality and scant supporting structural data, a compelling

Go with the Flow. Nist Study Proves PPV can Save Lives & Improve Safety

November 1, 2009
Author(s)
Stephen Kerber, Daniel M. Madrzykowski
The Building and Fire Research Laboratory at the National Institute of Standards and Technology (NIST) started a Fire Fighting Technology Group in order to focus on the research needs of the fire service. One key objective of the group is to provide

Matching Observed Alpha Helix Lengths to Predicted Secondary Structure

November 1, 2009
Author(s)
Brian D. Cloteaux, Nadezhda Serova
Because of the complexity in determining the 3D structure of a protein, the use of partial information determined from experimental techniques can greatly reduce the overall computational expense. We investigate the problem of matching experimentally

Mineralogical and Microstructural Evolution Review

November 1, 2009
Author(s)
Kenneth A. Snyder
The mineralogical and microstructural changes that occur in cementitious systems during hydration are summarized. The discussion concentrates on changes that may occur in iso-thermal systems that do not interact with the environment. The discussion

Regarding Electric Energy Savings, Power Factors, and Carbon Footprints: A Primer

October 31, 2009
Author(s)
Martin Misakian, Thomas L. Nelson, William E. Feero
A short primer is presented which describes the underlying physical theory of certain devices that reduce the current drawn from power distribution lines by improving the power factor of residential electric circuits. A brief discussion is provided of the

10-GHz Self-Referenced Optical Frequency Comb

October 30, 2009
Author(s)
Albrecht Bartels, Dirk Heinecke, Scott Diddams
For a decade the femtosecond laser based frequency comb has played a key role in high precision optical frequency metrology.While often referred to as a precise optical frequency ruler, its tick marks are in fact too densely spaced for direct observation

Getting Closer to Redefining the Kilogram

October 30, 2009
Author(s)
Zeina J. Kubarych
A redefinition to replace the last remaining artifact based SI unit, the kilogram, may occur as early as 2011. This article presents a short summary of the status of current international efforts focused on the redefinition and the internationally agreed

IMEP-28: Total Arsenic, Cadmium, Lead and Mercury in Food Supplements

October 30, 2009
Author(s)
Lane C. Sander, Stephen E. Long, Steven J. Christopher, Russell D. Day, Karen E. Murphy, Ines Baer, Beatriz de la Calle, Inge Verbist, Danny Vendelbo, Hakan Emteborg, Philip Taylor
The Institute for Reference Materials and Measurements (IRMM) of the Joint Research Centre (JRC), a Directorate-General of the European Commission, operates the International Measurement Evaluation Programme IMEP. It organises interlaboratory comparisons

Interoperability and the DMIS experience

October 30, 2009
Author(s)
John A. Horst
Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and

IREX I: Performance of Iris Recognition Algorithms on Standard Images

October 30, 2009
Author(s)
Patrick J. Grother, Elham Tabassi, George W. Quinn, Wayne J. Salamon
The IREX program supports the development of interoperable iris imagery for use in high performance biometric applications. The IREX evaluation, was conducted in cooperation with the iris recognition industry to demonstrate that standardized image formats

NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000

October 30, 2009
Author(s)
Donald A. Windover, David L. Gil, Albert Henins, James P. Cline
NIST recently released a standard reference material (SRM) for the calibration of high resolution X-ray diffraction (HRXRD) instruments. HRXRD is extensively used in the characterization of lattice distortion in thin single, epitaxial crystal layers on

Ontological Product Modeling for Collaborative Design

October 30, 2009
Author(s)
Conrad E. Bock, XuanFang Zha, Hyo W. Suh, Jae H. Lee
This paper presents a product modeling language for collaborative design that has the benefits of ontology and expanded capabilities in conventional product modeling. The proposed approach uses ontology to increase flexibility and accuracy in combining

Quantum walk on a line for a trapped ion

October 30, 2009
Author(s)
Peng Xue, Barry Sanders, Dietrich Leibfried
We show how a quantum walk can be experimentally realized for a single trapped ion and how to interpolate between the quantum and random walk by randomizing the phase of a generalized Hadamard coin flip. The signature of the quantum walk is manifested not
Displaying 27801 - 27825 of 73929
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