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NIST Authors in Bold

Displaying 27776 - 27800 of 73829

NIST Handbook 150-18 NVLAP Fasteners and Metals: 2009 Edition

October 20, 2009
Author(s)
Timothy Rasinski
NIST Handbook 150-18 program-specific handbook supplements NIST Handbook 150 by providing additional requirements, guidance, and interpretive information applicable specifically to the fastener and metals laboratory accreditation program (LAP).

Observation of Phase Transitions in Hydrogenated Y Films Via IR Emissivity Imaging

October 20, 2009
Author(s)
Jason Hattrick-Simpers, Ke Wang, Raymond Cao, Chun Chiu, Edwin J. Heilweil, Robert G. Downing, Leonid A. Bendersky
Direct observation of a sequence of phase transitions during hydrogenation of Y thin films has been realized through the use of in-situ isothermal IR emissivity measurements. The formation of different phases, α-Y(H), YH2 and YH3, has been identified based

An Improved Fast I d -V ^d g Measurement Technology With Expanded Application Range

October 19, 2009
Author(s)
Chen Wang, Liangchun (. Yu, Jason P. Campbell, Kin P. Cheung, Yi Xuan, Peide Ye, John S. Suehle, David Zhang
Fast Id-Vg measurements on very high performance devices (very low channel ON-resistance) and larger area devices (therefore large gate capacitance) are subject to serious distortions. Methods to minimize these distortions are introduced in this paper

Effects of sample preparation on bacterial colonization of polymers

October 19, 2009
Author(s)
Diana N. Zeiger, Christopher Stafford, Yajun Cheng, Stefan D. Leigh, Sheng Lin-Gibson, Nancy Lin
Characterization of materials developed for medical usage frequently includes studies in which the materials are inoculated with bacteria in order to assess biofilm formation. Differences in the bacteria are considered to be due to the material alone; the

Interferometry with a photon-number resolving detector

October 19, 2009
Author(s)
Aaron Pearlman, Christoph Wildfeuer, Jun Chen, Jingyun Fan, Alan L. Migdall, Jonathan Dowling
With photon-number resolving detectors, we show compression of interference fringes with in- creasing photon numbers for a Fabry-P erot interferometer. This feature provides a higher precision in determining the position of the interference maxima compared

NBTI: Why Won't This Thing Go Away?

October 19, 2009
Author(s)
Jason P. Campbell
The negative-bias temperature instability (NBTI) is a reliability problem that, in the last ten years, has risen from relative obscurity to become the most important reliability problem in advanced pMOSFET devices. Even though a significant effort has been

Optical Properties of Semiconductors

October 19, 2009
Author(s)
David G. Seiler, Stefan Zollner, Alain C. Diebold, Paul Amirtharaj
Rapid advances in semiconductor manufacturing and associated technologies have increased the need for optical characterization techniques for materials analysis and in-situ monitoring/control applications. Optical measurements have many unique and

TRC Thermodynamic Tables, Hydrocarbon Supplement H-138

October 19, 2009
Author(s)
Michael D. Frenkel
1. Table 23-14-2-(33.35100)-d/Page d-8950: New table for benzothiophenes, C8 to C12, containing density for the condensed phase at one bar, or at equilibrium vapor pressure above the boiling point. 2. Table 23-2-(5.12006)-db/Pages db-2620.0 to 2620.10: New

Fire Spread and Growth on Flexible Polyurethane Foam

October 18, 2009
Author(s)
William M. Pitts, Gregory Hasapis, Patrick Macatangga
A series of experiments designed to characterize fire spread and growth on flat samples of commercial non-fire-retarded flexible polyurethane foam have been performed. 1.2 m × 1.2 m square sections of foam were ignited along one edge, and the fire spread

Fast Iterative Solver for Convection-Diffusion Systems with Spectral Elements

October 16, 2009
Author(s)
Aaron Lott, Howard Elman
We introduce a solver and preconditioning technique based on Domain Decomposition and the Fast Diagonalization Method that can be applied to tensor product based discretizations of the steady convection-diffusion equation. The method is based on iterative

Wafer-level Hall Measurement on SiC MOSFET

October 16, 2009
Author(s)
Liangchun (. Yu, Kin P. Cheung, Vinayak Tilak, Greg Dunne, Kevin Matocha, Jason P. Campbell, John S. Suehle, Kuang Sheng
Low channel mobility is one of the biggest challenges to commercializing SiC MOSFETs. Accurate mobility measurement is essential for understanding the mechanisms that lead to low mobility. The most widely used effective mobility measurements overestimate

Benefits and Costs of Research: A Case Study of Improved Service Life Prediction

October 15, 2009
Author(s)
Robert E. Chapman, David T. Butry, Allison L. Huang, Douglas S. Thomas
This report focuses on a critical analysis of the economic impacts of research conducted by BFRL s Service Life Prediction (SLP) Program for High-Performance Polymeric Construction Materials. The SLP Program is an interdisciplinary research effort within

Fabrication with Flip-Chip Lamination

October 15, 2009
Author(s)
Mariona Coll Bau, Curt A. Richter, Christina Hacker
Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, MRSEC surface physics colloquium, University of Maryland, College Park, 10-09.

HYDRATED PHASES IN BLENDED CEMENTITIOUS SYSTEMS FOR NUCLEAR INFRASTRUCTURE

October 15, 2009
Author(s)
Kenneth A. Snyder, Paul E. Stutzman, Jacob Philip, David W. Esh
The hydration products of varying proportions of portland cement, fly ash, ground granulated blast furnace slag, and silica fume in blended systems were identified and quantified. The proportion of portland cement varied from 100 % down to 10 %. The

Temperature dependence of spin-torque-driven self-oscillators

October 15, 2009
Author(s)
William H. Rippard, Matthew R. Pufall, Thomas Cecil, Thomas J. Silva, Stephen E. Russek, M. L. Schneider
We have measured the temperature dependence of spin-torque-driven self-oscillations in point-contact nanooscillators for both in-plane and out-of-plane applied fields. We find that the linewidth for both field geometries is qualitatively similar. In the

An Analysis of CVSS Version 2 Vulnerability Scoring

October 14, 2009
Author(s)
Karen A. Scarfone, Peter M. Mell
The Common Vulnerability Scoring System (CVSS) is a specification that is used to measure the relative severity of software vulnerabilities. CVSS version 2, which was finalized in June 2007, was designed to address several deficiencies discovered during
Displaying 27776 - 27800 of 73829
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