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Search Publications

NIST Authors in Bold

Displaying 10476 - 10500 of 13225

Novel Method for TEM Characterization of Deformation Under Nanoindents in Nanolayered Materials

March 1, 2004
Author(s)
D E. Kramer, M Savage, A Lin, Timothy J. Foecke
… structures increase with decreasing bilayer thickness, in a relation analogous to Hall-Petch behaviorm, down to some … by traditiional microstrucutes. Further reduction in bilayer thickness result in no additional increase, or even a decrease, in strength. … for TEM Characterization of Deformation Under Nanoindents in Nanolayered Materials …

A Rapid Prototyping Technique for the Fabrication of Solvent-Resistant Structures

October 1, 2003
Author(s)
C Harrison, J Cabral, Christopher M. Stafford, Alamgir Karim, Eric J. Amis
… channels up to and exceeding one millimeter in height. The fabrication of channels with such dimensions … and time-consuming. Furthermore, we show that this technology can be used to fabricate channels with a depth …

Assessment Activities at the NIST Research Library

June 11, 2003
Author(s)
Barbara P. Silcox
… Library of the National Institute of Standards and Technology. It is to be part of a session on Using Outcome … help us when we are planning and negotiating budgets; both in terms of tactical needs and long term strategic direction. Speakers will illustrate the ways in which we can collect and present convincing outcomes for …

Structure and Properties of Consolidated Amorphous Metal Powder

March 1, 2003
Author(s)
Frank S. Biancaniello, Tony Zahrah, Rodney D. Jiggetts, L J. Rowland, Steven P. Mates, Stephen D. Ridder, S Glasmachers
… metallic glass (BMG) components up to several centimeters in cross section. Mechanical characterization of these … to crystalline metal alloys. The extension of this technology to the production of large structural amorphous …

NIST CFIT: Testing Disk Imaging Tools

January 27, 2003
Author(s)
James R. Lyle
… There is a critical need in the law enforcement community to ensure the reliability of … (CFTT) project at the National Institute of Standards and Technology (NIST) is to establish a methodology for testing …

Measurement of the 100 nm NIST SRM 1963 by Laser Surface Light Scattering

November 1, 2002
Author(s)
Thomas A. Germer, George W. Mulholland, Jae Hyun Kim, S H. Ehrman
… a complete assessment of the measurement uncertainties. In this manuscript, we describe a light scattering … measurement of the National Institute of Standards and Technology (NIST) Standard Reference Material (SRMO) 1963 … by the reproducibility of the measurement. Uncertainties in the substrate optical properties, the thickness and …

Application of an On-Line Weld Monitoring System

September 12, 2002
Author(s)
Thomas A. Siewert, Ivan Samardzic, Stefanija Klaric
… Thanks to the continual development of information technology and electronics, it is possible to improve the … the welding process. One system of this type was developed in the Mechanical Engineering Faculty in Slavonski Brod during the joint USA-CRO project, JF 137. …

A New NIST Mitochondrial DNA Interactive Website

August 1, 2002
Author(s)
Barbara C. Levin, L A. Tully, Diane K. Hancock, Frederick P. Schwarz, M S. Lee
… pairs) was determined and published by Anderson et al. in 1981. A mtDNA standard reference material (SRM 2392) is … now available from the National Institute of Standards and Technology to provide quality control when sequencing mtDNA … mutation detection (Levin et al., 1999). We are currently in the process of adding DNA from the cell culture HL-60 to …

NIST CFTT: Testing Disk Imaging Tools

August 1, 2002
Author(s)
James R. Lyle
… There is a critical need in the law enforcement community to ensure the reliability of … (CFTT) project at the National Institute of Standards and Technology (NIST) is to establish a methodology for testing …

NIST CFTT: Testing Disk Imaging Tools

August 1, 2002
Author(s)
James R. Lyle
… There is a critical need in the law enforcement community to ensure the reliability of … (CFTT) project at the National Institute of Standards and Technology (NIST) is to establish a methodology for testing …

Intercomparison of a Correlated-Photon-Based Method to Measure Detector Quantum Efficiency

May 1, 2002
Author(s)
Alan L. Migdall, Stefania Castelletto, Ivo P. Degiovanni, M L. Rastello
… two laboratories, the National Institute of Standards and Technology (NIST) and the Istituto Elettrotecnico Nazionale … via somewhat similar parametric downconversion setups in both laboratories. The quantum efficiency of a single … photon counting avalanche photodiode module was measured in both the NIST and IEN setups. The aim was to use an …

Synchrotron Ultraviolet Radiation Facility SURF III

March 1, 2002
Author(s)
Uwe Arp, Charles W. Clark, Alex P. Farrell, E Fein, Mitchell L. Furst, Edward W. Hagley
… The National Institute of Standards and Technology (NIST) has operated the Synchrotron Ultraviolet … was converted into a storage ring, called SURF II, in 1974. Then in 1998, motivated mainly by limitations in the accuracy of …

Interference Aware Bluetooth Packet Scheduling

November 1, 2001
Author(s)
Nada T. Golmie, Nicolas Chevrollier, I El bakkouri
… Bluetooth is a radio technology for Wireless Personal Area Networks operating in the 2.4 GHz ISM band. Since both Bluetooth and IEEE 802.11 … use the same frequency band and may likely come together in a laptop or may be close together at a desktop, …

Wavelength Characterization of a Molecular F2 Laser at 157 nm for DUV Lithography

May 1, 2001
Author(s)
Craig J. Sansonetti, Joseph Reader
… spectrograph at the National Institute of Standards and Technology. Lines from a Pt/Ne hollow cathode lamp served as … The optical paths were arranged so as to avoid shifts in line positions arising from possible differences in illumination of the grating by the two sources. The …

Precision Measurement of Wavelengths Emitted by a Molecular Fluorine Laser at 157 nm

April 1, 2001
Author(s)
Craig J. Sansonetti, Joseph Reader, K Vogler
… spectrograph at the National Institute of Standards and TEchnology. Lines from a Pt/Ne hollow cathode lamp served as … The optical paths were arranged so as to avoid shifts in line positions arising from possible differences in illumination of the grating by the two sources. The …

Wavelength standards for optical communications

January 1, 2001
Author(s)
Sarah L. Gilbert, William C. Swann, Tasshi Dennis
… references for National Institute of Standards and Technology (NIST) internal calibration and transfer standards … the absorption lines of acetylene and hydrogen cyanide in the 1500 nm region. Two higher accuracy references for …

A Denial-of-Service Resistant Intrusion Detection Architecture

October 1, 2000
Author(s)
Peter M. Mell, D G. Marks, Mark McLarnon
… invisible to an attacker's normal means of seeing in a network. In the event of a successful attack, the architecture allows … These capabilities are obtained by using mobile agent technology,utilizing network topology features, and by …
Displaying 10476 - 10500 of 13225
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