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Search Publications

NIST Authors in Bold

Displaying 6601 - 6625 of 13218

Modeling Superconformal Electrodeposition Using an Open Source PDE Solver

October 16, 2008
Author(s)
Daniel Wheeler, Jonathan E. Guyer
… of high aspect ratio features such as trenches or vias in the Damascene metallization process. Superconformal … particular combinations of chemical additives are included in an electrolyte. The additives enable preferential metal … walls close off, avoiding the formation of voids or seams in the feature. In order to predict and characterize this …

Personal Identity Verification (PIV) of Federal Employees and Contractors

January 24, 2022
Author(s)
National Institute of Standards and Technology (NIST), Hildegard Ferraiolo, Andrew Regenscheid, Salvatore Francomacaro, David Cooper, Ketan Mehta, Annie W. Sokol, David Temoshok, Gregory Fiumara, Justin Richer, James L. Fenton, Johnathan Gloster, nabil anwer
… National Institute of Standards and Technology (NIST), Hildegard Ferraiolo , Andrew Regenscheid , …

Four terminal-pair measurements of ceramic capacitors

June 28, 2024
Author(s)
Stephan Schlamminger, Yicheng Wang, Andrew Koffman, Jordan Love
… for the complete model. First, the location of the pole in the admittance in the frequency range from 100 kHz to 20 MHz. This … bridge. From these two measurements, the relative change in frequency for frequencies ranging from 100 Hz to 100 kHz … Proceedings of IEEE Instrumentation and Measurement Technology Conference …

Dominant Uncertainty in Traceable Millimeter-Wave Modulated Signal Source for OTA Calibration

May 4, 2020
Author(s)
Rob Horansky, Diogo Ribeiro, Jeffrey Jargon, Kate Remley
… In the 5G, millimeter-wave frequency region, over-the-air … systems will benefit from a traceable modulated-signal in the free-field for verification. We present the steps to … antenna characterization, and tracking correlations in uncertainties. We will present our study of the dominant …

Non-tunneling origin of the 1/f noise in SiC MOSFET

July 1, 2018
Author(s)
Kin (Charles) Cheung, Jason Campbell
… 1/f noise is the result of inversion charge tunneling in and out of bulk traps in the gate oxide near the interface. The tunneling nature is … technique of trap profiling using 1/f noise is based on. In this work, we examine the tunneling pathways in SiC … 2018 International Conference on IC Design and Technology …

Unsupervised Clustering for Millimeter-Wave Channel Propagation Modeling

February 11, 2018
Author(s)
Jian Wang, Camillo Gentile, Jelena Senic, Roy Sun, Peter B. Papazian
… (with 0.5 ns resolution) and Doppler-frequency shift. In addition, because the receiver is mounted on a mobile … hundreds of different transmitter- receiver configurations in just minutes. Therefore channel-model reduction, including … step, must be reliable, consistent, and unsupervised. In this paper, we describe a simple clustering algorithm …

A Physics-Based Simple Series Resistance Extraction Methodology

June 1, 2011
Author(s)
Kin P. Cheung, Jason P. Campbell
… Series resistance has become a serious obstacle encountered in the development of advanced CMOS devices. At the same time, series resistance quantification in these same advanced CMOS devices is a difficult challenge. In this study, we demonstrate a very simple series resistance …

High-Resolution Passive Video-Rate Imaging at 350 GHz

May 26, 2011
Author(s)
Daniel T. Becker
… a 350 GHz cryogenic passive video imaging system for use in standoff security applications. This demonstration system … Passive Millimeter-Wave Imaging Technology XIV …

A New Interface Defect Spectroscopy Method

April 11, 2011
Author(s)
Jason T. Ryan, Liangchun (. Yu, Jae Han, Joseph J. Kopanski, Kin P. Cheung, Fei Zhang, Chen Wang, Jason P. Campbell, John S. Suehle, Viniyak Tilak, Jody Fronheiser
… the amphoteric nature of Si/SiO2 interface states in production quality sub-micron devices is demonstrated. It … International Symposium on VLSI Technology, Systems and Applications …

The Negative Bias Temperature Instability vs. High-Field Stress Paradigm

May 18, 2009
Author(s)
Jason P. Campbell, Kin P. Cheung, John S. Suehle, A Oates
… that the anomalously large initial degradations reported in the recent literature are actually due to high-field … care must be taken to account for this component in NBTI analysis. Collectively, our observations indicate … high-field stress component is present and unaccounted for in a large portion of the recent NBTI literature. …

Phenomenology of Passive Broadband Terahertz Images

February 15, 2006
Author(s)
Charles Dietlein, A. Luukanen, Francois Meyer, Zoya Popovic, Erich N. Grossman
… are analyzed with two specific parameters of interest in mind. First, the minimum system noise level for clothing … ESA Workshop on Millimetre-wave Technology and Applications …

Terahertz circular variable filters

February 15, 2006
Author(s)
Erich N. Grossman, Charles Dietlein, A. Luukanen
… analogous to the circular-variable filters commonly used in the infrared for low to moderate resolution spectroscopy, … that display broad but distinct spectral features in the submillimeter wavelength band. Low-cost fabrication … show resolving powers of >6, presently limited by beamsize in the measurement setup, and insertion loss <0.5 dB. …

Novelty Detection: The TREC Experience

October 1, 2005
Author(s)
Ian M. Soboroff, Donna K. Harman
… contains something new which the user has not seen before. In the TREC novelty track, the task was to highlight … sentences containing relevant and new information in a short, topical document stream. This is analogous to … Proceedings of the 2005 conference on Human Language Technology …

Transformation, Ranking, and Clustering for Face Recognition Algorithm Comparison

March 1, 2002
Author(s)
Stefan D. Leigh, Nathanael A. Heckert, Andrew L. Rukhin, J G. Phillips, Elaine M. Newton, M Moody, K Kniskern, S Heath
The performance of face recognition algorithms is recently of increased interest, although to date empirical analyses of algorithms have been limited to rank-based scores such a cumulative match score and receiver operating characteristic. This paper

Sapphire Statistical Characterization and Risk Reduction Program

September 1, 2001
Author(s)
D R. McClure, R W. Cayse, David R. Black, S M. Goodrich, K Peter, D Lagerloef, D C. Harris, D McCullum, D H. Platus, C E. Patty, Robert S. Polvani
… or dome and, as much as possible, coupons were fabricated in the same manner as the corresponding part of the window or … specifications from the same blanks by another fabricator. In laser thermal shock tests, sapphire performed better than …
Displaying 6601 - 6625 of 13218
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