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Non-tunneling origin of the 1/f noise in SiC MOSFET

Published

Author(s)

Kin (Charles) Cheung, Jason Campbell

Abstract

Abstract: It has long been established that MOSFET random telegraph noise and the cumulative 1/f noise is the result of inversion charge tunneling in and out of bulk traps in the gate oxide near the interface. The tunneling nature is a key concept upon which the technique of trap profiling using 1/f noise is based on. In this work, we examine the tunneling pathways in SiC MOSFETs and show that the 1/f noise observed in SiC MOSFETs is likely of a completely different nature involving above band edge interface states that do not require tunneling to capture the inversion charge.
Proceedings Title
2018 International Conference on IC Design and Technology
Conference Dates
June 4-6, 2018
Conference Location
Otranto, IT

Keywords

1/f noise, RTN, SiC, MOSFET, local field

Citation

Cheung, K. and Campbell, J. (2018), Non-tunneling origin of the 1/f noise in SiC MOSFET, 2018 International Conference on IC Design and Technology, Otranto, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925449 (Accessed April 23, 2024)
Created July 1, 2018, Updated April 19, 2022