Ryan, J.
, Yu, L.
, Han, J.
, Kopanski, J.
, Cheung, K.
, Zhang, F.
, Wang, C.
, Campbell, J.
, Suehle, J.
, Tilak, V.
and Fronheiser, J.
(2011),
A New Interface Defect Spectroscopy Method, International Symposium on VLSI Technology, Systems and Applications, Hsinchu, -1
(Accessed October 13, 2024)