@conference{48741,
  author = {Jason Ryan and Liangchun Yu and Jae Han and Joseph Kopanski and Kin Cheung and Fei Zhang and Chen Wang and Jason Campbell and John Suehle and Viniyak Tilak and Jody Fronheiser},
  title = {A New Interface Defect Spectroscopy Method},
  year = {2011},
  month = {2011-04-11},
  publisher = {International Symposium on VLSI Technology, Systems and Applications, Hsinchu, -1},
  language = {en},
}