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Displaying 5626 - 5650 of 13218

Effect of Self-Assembled Monolayer Film Order on Nanofriction

May 11, 2006
Author(s)
S Sambasivan, S Hsieh, Daniel A. Fischer, Stephen M. Hsu
… increasingly being explored as potential protective films in devices friction and adhesion. However, accurate … order of a series of SAMs with different chain lengths in order to understand nanofriction measurements. A series of … of lower friction associated with longer chain length in macro-test results. To explain these observations, we use …

High-accuracy determination of epitaxial AlGaAs composition with inductively coupled plasma optical emission spectroscopy

March 1, 2006
Author(s)
Kristine A. Bertness, C. M. Wang, Marc L. Salit, Gregory C. Turk, Therese A. Butler, Albert J. Paul, Larry Robins
… fraction were observed. The lowest uncertainty was found in the PL measurements, allowing certification of Al mole fraction x in standard reference materials to an expanded uncertainty … the uncertainty analysis, as well as possible improvements in those uncertainties, are discussed. …

Optical Bandgaps and Composition Dependence of Hafnium Aluminate Thin Films grown by Atomic Layer Chemical Vapor Deposition

November 17, 2005
Author(s)
Nhan V. Nguyen, Safak Sayan, Igor Levin, James R. Ehrstein, I.J.R. Baumvol, C. Driemeier, L Wielunski, Pui-Yee Hung, Alain C. Diebold
… (ALCVD) of different aluminum contents were investigated in this article. Vacuum Ultra-Violet Spectroscopic … Analysis (NRA) were employed to characterize these films. In the analyses of ellipsometry data, a double Tauc-Lorentz … equal (1:1) ratio of HfO2 and Al2O3 precursors pulsed in each deposition cycle. The shift of Eg to the higher …

DNSSEC Test and Measurement Tools: Secure Zone Integrity Tester v0.9.3, Zone Monitoring Tool v0.9, dns Trace : traffic statistics collection tool, querysim : DNS query workload monitoring tool

October 1, 2005
Author(s)
Scott W. Rose, Darrin J. Santay, Douglas Montgomery, Kevin L. Mills, Stephen Quirolgico, M Ramaswamy
We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the bit-stream, generation of random numbers and processing of the sifting algorithm are all handled

GaAs Buffer Layer Morphology and Lateral Distributions of InGaAs Quantum Dots

May 1, 2005
Author(s)
Alexana Roshko, Todd E. Harvey, Susan Y. Lehman, Richard Mirin, Kristine A. Bertness, Brittany Hyland
… on the buffer grown with a pulsed start. The variations in dot distributions on these three buffer types were … not determine the density of QDs. The standard deviation in dot density was found to vary from 16 to 28 % of the … 26 x 26 mm2 region of 5 cm wafers. The standard deviation in dot height was 10 % or less of the average height. An …

Storage Conditions for High-Accuracy Composition Standards of AlGaAs

May 1, 2005
Author(s)
Kristine A. Bertness, Alexana Roshko, S. E. Asher, Craig L. Perkins
… 10 nm of the surface for all specimens stored in controlled environments for over three years. We also … structure measuring the height of the oxides formed in air. Surface contamination was examined in more detail with time-of-flight secondary ion mass … Journal of Vacuum Science and Technology B …

Calibrated 200 GHz Waveform Measurement

April 1, 2005
Author(s)
Dylan Williams, Paul D. Hale, Tracy S. Clement
… system. The new calibration characterizes the source in both the time and frequency domains, and accounts for all impedances and multiple reflections in the measurement system. … IEEE Photonics Technology Letters …

General Purpose Calculator for Outdoor Propagation Loss

February 1, 2005
Author(s)
Leonard E. Miller, Camillo Gentile, D Kaspar
We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the bit-stream, generation of random numbers and processing of the sifting algorithm are all handled

A Coupled Arc and Droplet Model of GMAW

January 8, 2005
Author(s)
Timothy P. Quinn, M Szanto, T Gilad, I Shai
… and the welding parameters are the input variables in the model. The geometry of the numerical model was … can range up to 20,000 K where there is more uncertainty in the thermophysical properties of the plasma, and the properties in this range are highly nonlinear. For this range, the …

Nanotechnology with Atom Optics

November 1, 2004
Author(s)
Jabez J. McClelland, Shannon B. Hill, M Pichler, Robert Celotta
… is presented, with emphasis on how it can be applied in the field of nanotechnology. Two specific examples are … discussion is presented of how they can impact progress in the development of nanotechnology. … Science and Technology of Advanced Materials …

Wet chemical cleaning of plasma oxide grown on heated (001) InP surfaces

August 1, 2004
Author(s)
Bogdan Lita, O Pluchery, R L. Opila, Y J. Chabal, G. Bunea, J P. Holman, E J. Bekos
… chemical species that reside on the wafer surface. In this article, we report the results of our investigations … about 10 nm thick, and that they impede wafer processing. In addition, these "plasma oxides" do not show significant … after removing the wafer from the plasma and storing it in ambient. Moreover, we identify several aqueous solutions, …

X-Ray Absorption Imaging of Hg Vapor in a Ceramic Metal-Halide Lamp Using Synchrotron Radiation

May 1, 2004
Author(s)
John J. Curry, H G. Adler, A MacPhee, Suresh Narayanan, J C. Wang
… technique based on absorption of x-rays by the Hg vapor in a high-intensity discharge lamp has been extended using … Hg density during cool-down. The cold-spot temperature in a 150 W ceramic lamp containing Hg and rare-earth iodides … been identified and methods for overcoming thislimitation in future work are proposed. Other aspects of the technique …
Displaying 5626 - 5650 of 13218
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