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Search Publications

NIST Authors in Bold

Displaying 2876 - 2900 of 13215

Software for an Automated Machining Workstation

September 1, 1986
Author(s)
Thomas R. Kramer, Jay S. Jun
… The National Bureau of Standards' Automated Manufacturing Research Facility (AMRF) includes three machining workstations. In the vertical workstation (VWS) metal parts are machined … activity stages and PMOS are handled within a Sun computer in software written in LISP. …

Clarifying the Formation of Equiaxed Grains and Microstructural Refinement in the Additive Manufacturing of Binary Ti-Cu

November 14, 2024
Author(s)
Alec Saville, Adriana Eres-Castellanos, Andrew Kustas, Levi Van Bastian, Donald Susan, Dale Cillessen, Sven Vogel, Natalie Compton, Kester Clarke, Amy Clarke
… Controlling microstructural evolution in metallic additive manufacturing (AM) is difficult, especially in producing … Grains and Microstructural Refinement in the Additive Manufacturing of Binary Ti-Cu …

Activity Model for Homogenization of Data Sets in Laser-based Powder Bed Fusion

January 14, 2017
Author(s)
Shaw C. Feng, Paul W. Witherell, Duck B. Kim
… Additive Manufacturing (AM) processes are the integration of many … such as material metrology, design, process planning, in-situ and off-line measurements, and controls. Major … be readily shared among the components of that system. In an attempt to better homogenization this data, this paper …

An Adaptive Error Correction Method Using Feature Based Analysis Technique for Machine Performance Improvement ? Part 2: Experimental Verification

November 1, 1994
Author(s)
J Mou, S Cetinkunt, Alkan Donmez
… for machine performance improvement were presented in Part I of this paper. Here, in Part II, the experimental verification of the derived … to compensate the machine tool error for more precise manufacturing. … Machine tool error, Machine tool modeling, Manufacturing Equipment, Process Control …

Integration of vertically-aligned carbon nanotubes with superconducting nanowire single photon detectors

November 27, 2023
Author(s)
Dana Rampini, Chris Yung, Bakhrom Oripov, Solomon I. Woods, John H. Lehman, Sae Woo Nam, Adam McCaughan
… We report on initial fabrication efforts in the integration of superconducting nanowire single-photon … such as spectroscopy, optical communication, and imaging in light starved environments. We developed two fabrication … The membrane style devices showed no degradation in the superconducting properties of the nanowires. …

Calibrated thermal microscopy of the tool-chp interface in machining

January 1, 2003
Author(s)
Matthew A. Davies, Howard W. Yoon, Tony L. Schmitz, Timothy J. Burns, Michael Kennedy
… laboratory at the National Institute of Standards and Technology. The emissivity of the machined material is … Machining Science and Technology … Calibrated thermal microscopy of the tool-chp interface in machining …

Probing Surface and Bulk Chemistry in Resist Films Using Near Edge X-Ray Absorption Fine Structure

May 1, 2002
Author(s)
Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Ronald L. Jones, Eric K. Lin, Christopher Soles, Wen-Li Wu, Daniel A. Fischer, S Sambasivan, D L. Goldfarb, M Angelopoulos
… interfacial or surface phenomenon, which causes deviations in the pattern profile near the interface. Striking examples … include T-topping, closure, footing, and undercutting. In particular, initial focus is placed on the resist / air … of lithographic patterns is caused by a difference in the deprotection kinetics at the resist surface relative …

Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques

April 24, 2025
Author(s)
Alexandre Pereira, Simon Spindler, Zhitian Shi, Lucia Romano, Michal Rawlik, Federica Marone, Martin Stauber, Marco Stampanoni, Daniel Josell
… is challenging. The two widely used technologies for manufacturing gratings are based on gold electroplating in polymeric or silicon templates. Here, gratings … profile to be modeled accurately. These models were used in a wave-propagation simulation to predict the effects of …

IP Security in Structured ASIC: Challenges and Prospects

September 25, 2024
Author(s)
Rasheed Almawzan, Sudipta Paria, Aritra Dasgupta, Kostas Amberiadis, Swarup Bhunia
… With the globalization of hardware manufacturing and the growing demand for electronics, … only designed to protect against limited attack surfaces. In this paper, we analyze the IP security issues in structured ASIC and discuss solutions to address them. We … IP Security in Structured ASIC: Challenges and Prospects …

Certification of Standard Reference Material 3289 Multivitamin Tablets

March 18, 2022
Author(s)
Hugh Hayes, Jerome Mulloor, Michael Nelson, Kate Rimmer, Lee L. Yu, James H. Yen
… effort between the National Institute for Standards and Technology (NIST) and the National Institutes of Health … challenges associated with the measurement of vitamins in dietary supplement matrices. The material was purchased … preparations, results, and data analysis are discussed in the following report. …

High temperature reflectometer for spatially resolved spectral directional emissivity of laser powder bed fusion processes

August 26, 2020
Author(s)
David C. Deisenroth, Leonard M. Hanssen, Sergey Mekhontsev
… Additive manufacturing involving layer-wise selective laser melting of … at the United States National Institute of Standards and Technology (NIST) an integrating hemispherical reflectometer … presented. It is found that emissivity measurements are in good agreement with literature values at the melting point …

Chip Scale Atomic Devices

August 14, 2018
Author(s)
John E. Kitching
… silicon micromachining and advanced diode laser technology to create compact, low-power and manufacturable … and other instruments and discuss the many applications in which these novel instruments are being used. Finally, we …

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Robert A. Clary, Michael L. McGlauflin, Eric P. Whitenton, Christopher J. Evans
… (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two … were developed at the National Institute of Standards and Technology (NIST). These standard bullets are intended for use in crime laboratories as check standards to help verify that …

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Christopher J. Evans, Michael L. McGlauflin, Eric P. Whitenton, Robert A. Clary
… (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two … were developed at the National Institute of Standards and Technology (NIST). These standard bullets are intended for use in crime laboratories as check standards to help verify that …

CAD-Directed Inspection

January 1, 1984
Author(s)
Ted Hopp
… We all know that the manufacturing process has a major impact on product cost, … overruns, inferior quality, and inadequate performance in our weapons systems are often traceable to deficiencies in … to provide production capability adequate in terms of technology to match the sophistication of the products being …

Short-Term Characterization of Building Integrated Photovoltaic Panels

February 1, 2003
Author(s)
Arthur H. Fanney, Brian P. Dougherty, Mark W. Davis
… decisions. The National Institute of Standards and Technology (NIST) has undertaken a multi-year project to … building integrated, building technology, mono-crystalline, photovoltaic, polycrystalline, …

NIST Workshop on Needs for Reference Biomaterials

August 1, 2000
Author(s)
John A. Tesk
… was held at the National Institute of Standards and Technology (NIST) to obtain a clearer assessment of the … regard to standards, research, and regulatory purposes. In these applications, the RBMs would be used (as are other … and the Food and Drug Administration (FDA) to cooperate in the development of reference materials. NIST, in …
Displaying 2876 - 2900 of 13215
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