Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Calibrated thermal microscopy of the tool-chp interface in machining

Published

Author(s)

Matthew A. Davies, Howard W. Yoon, Tony L. Schmitz, Timothy J. Burns, Michael Kennedy

Abstract

This paper presents the results of calibrated, microscopic measurement of the temperature fields at the tool-chip interface during the steady-state, orthogonal machining of AISI 1045 steel. The measurement system consists of a nearly diffraction limited infrared imaging microscope with a 0.5 mm square target area, and a spatial resolution of less than 5 mm. The system is based on a commercial InSb 128 x 128 focal plane array with an all-reflective microscope objective and a frame acquisition time of less than 1 ms. The microscope is calibrated using a standard blackbody source from the radiance temperature calibration laboratory at the National Institute of Standards and Technology. The emissivity of the machined material is determined from the infrared reflectivity measurements. Thermal images of steady state machining are measured on a diamond-turning class lathe for a range of machining parameters. The measurements are validated by two methods: (1) energy flux calculations made directly from the thermal images using a control-volume approach; and (2) a simplified finite-difference simulation. The standard uncertainty of the temperature measurements is estimated to be about 40?C at 700?C.
Citation
Machining Science and Technology
Volume
7 (2)

Keywords

machining, Micropyrometry, tool-chip inteface

Citation

Davies, M. , Yoon, H. , Schmitz, T. , Burns, T. and Kennedy, M. (2003), Calibrated thermal microscopy of the tool-chp interface in machining, Machining Science and Technology (Accessed February 24, 2024)
Created January 1, 2003, Updated February 19, 2017