Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques

Published

April 24, 2025

Author(s)

Alexandre Pereira, Simon Spindler, Zhitian Shi, Lucia Romano, Michal Rawlik, Federica Marone, Martin Stauber, Marco Stampanoni, Daniel Josell

Abstract

The performance of an X-ray grating interferometry system depends on the geometry and quality of the gratings. Fabrication of micrometer-pitch high-aspect-ratio gold gratings, which are essential for measuring small refraction angles at higher energies, is challenging. The two widely used technologies for manufacturing gratings are based on gold electroplating in polymeric or silicon templates. Here, gratings manufactured by both approaches were inspected using conventional microscopy, X-ray synchrotron radiography, and computed laminography to extract characteristic features of the gratings profile to be modeled accurately. These models were used in a wave-propagation simulation to predict the effects of the gratings' geometry and defects on the quality of a Talbot-Lau interferometer in terms of visibility and absorption capabilities. The simulated outcomes of grating features produced with both techniques could eventually be observed and evaluated in a table-top Talbot-Lau-Interferometer.

Citation

Nature - Scientific Reports

Volume

15

Pub Type

Journals

Download Paper

https://doi.org/10.1038/s41598-025-98148-z

Local Download

Keywords

gold electrodeposition, gratings, imaging, superconformal, interferometer

Citation

Pereira, A. , Spindler, S. , Shi, Z. , Romano, L. , Rawlik, M. , Marone, F. , Stauber, M. , Stampanoni, M. and Josell, D. (2025), Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques, Nature - Scientific Reports, [online], https://doi.org/10.1038/s41598-025-98148-z, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959239 (Accessed May 14, 2025)