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Displaying 3251 - 3275 of 4212

An Iterative Algorithm for Calculating Stylus Radius Unambiguously

September 24, 2011
Author(s)
Theodore V. Vorburger, Xiaoyu A. Zheng, Thomas B. Renegar, Jun-Feng Song, Li Ma
The stylus radius is an important specification for stylus instruments and is commonly provided by instrument manufacturers. However, it is difficult to measure the stylus radius unambiguously. Accurate profiles of the stylus tip may be obtained by

DIFFUSION-CONTROLLED REFERENCE MATERIAL FOR VOC EMISSIONS TESTING

August 29, 2011
Author(s)
Zhe Liu, Cynthia H. Reed, Steve Cox, John Little
To improve the reliability and accuracy of tests used to measure emissions of volatile organic compounds (VOCs) from samples of interior building products, the National Institute of Standards and Technology (NIST) and Virginia Tech (VT) have created a

Surrogate Mixture Models for the Thermophysical Properties of Aviation Fuel Jet-A

May 27, 2010
Author(s)
Marcia L. Huber, Eric W. Lemmon, Thomas J. Bruno
We developed surrogate mixture models to represent the thermophysical properties of two samples of aviation turbine fuel Jet-A. One sample is a composite of numerous batches from a multiple manufacturers and is considered to be a representative fuel. A

Nanomechanical Measurements and Tools

February 23, 2010
Author(s)
Robert F. Cook
… a critical requirement for the commercial innovation and manufacturing of these devices is the parallel development of …

A Step Towards CO2-Neutral Aviation

November 20, 2007
Author(s)
Andreja Brankovic, Robert C. Ryder, Robert C. Hendricks, Marcia L. Huber
An approximation method for evaluation of the caloric equations used in combustion chemistry simulations is described. The method is applied to generate the specific heat, static enthalpy, and Gibb's free energy equations for fuel mixtures of interest to

RM 8111: Development of a Prototype Linewidth Standard

May 1, 2006
Author(s)
Michael W. Cresswell, William Gutherie, R. Dixon, Richard A. Allen, Christine E. Murabito, Joaquin (. Martinez
… CD-metrology instruments that are used in semiconductor manufacturing. The reference material is configured as a 9-mm …

Advanced Coatings R&D for Pipelines and Related Facilities

September 1, 2005
Author(s)
Richard E. Ricker
This workshop was held at the National Institute of Standards and Technology s Gaithersburg, Maryland campus June 9-10, 2005 with support from the Office of Pipeline Safety of the U.S. Department of Transportation. A steering committee composed of 20

Microfabricated Atomic Frequency References

August 1, 2005
Author(s)
John Kitching, Svenja A. Knappe, Li-Anne Liew, John M. Moreland, Peter D. Schwindt, V Shah, V Gerginov, Leo W. Hollberg
… fabrication and assembly, which would substantially reduce manufacturing costs. It is anticipated that a complete …

Microfabricated atomic frequency references

June 7, 2005
Author(s)
John E. Kitching, Svenja A. Knappe, Li-Anne Liew, John Moreland, P Schwindt, V Shah, Vladislav Gerginov, Leo W. Hollberg
… fabrication and assembly, which would substantially reduce manufacturing costs. It is anticipated that a complete …

Overlay Metrology Simulations: Analytical and Experimental Validations

May 1, 2003
Author(s)
Joel L. Seligson, B Golovanevsky, J M. Poplawski, M E. Adel, Richard M. Silver
We have previously reported on an overlay metrology simulation platform, used for modeling both the effects of overlay metrology tool behavior and the impact of target design on the ultimate metrology performance. Since our last report, the simulations by
Displaying 3251 - 3275 of 4212
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