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NIST Authors in Bold

Displaying 2751 - 2775 of 4212

A Single-Pixel Touchless Laser Tracker Probe

October 15, 2015
Author(s)
Josh Gordon, David R. Novotny, Alexandra Curtin
… Spatial Metrology, Machine Vision, Alignment, Surveying, Manufacturing, Instrumentation, Optics …

Performance Measurement of Mobile Manipulators

April 24, 2015
Author(s)
Roger V. Bostelman, Tsai Hong Hong, Jeremy A. Marvel
… mobile manipulator, reproducible performance, smart manufacturing, ground truth, test methods, artifact …

Viewing Technologies for CAD Models

August 1, 2003
Author(s)
Michelle P. Steves, Simon P. Frechette
… Computer-Aided Design, lightweight viewing applications, manufacturing, technology …

Preparing for 6G: Developing best practices and standards for industrial measurements of low-loss dielectrics

May 23, 2023
Author(s)
Lucas Enright, Marzena Olszewska-Placha, Michael Hill, Say Phommakesone, Daisuke Kato, Charles Hill, Hanna Kahari, Chiawen Lee, Chang-Sheng Chen, Nate Orloff, Malgorzata Celuch, Urmi Ray
With growing interest in millimeter-wave (mmWave, 30 GHz – 300 GHz) technologies, researchers and manufacturers need standard reference materials and best practices for measurement validation, material acceptance, and quality assurance. Today, there is no

NIST: A Century in the Business of Fire Safety

February 19, 2017
Author(s)
Richard Gann
This year, the National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards (NBS), turned 100 years old. During that century, NBS/NIST measurement technology has done much to enable the business of fire safety. Today

Engineering Change Management Concepts for Systems Modeling

April 22, 2013
Author(s)
Conrad E. Bock, Allison Barnard Feeney
A significant cost of manufactured systems arises in changing system specifications after they have been built and delivered to customers. This might be due to errors in the original specifications, feedback from customers, competition from other producers

First approaches to standard protocols and reference materials for the assessment of potential hazards associated with nanomaterials

September 19, 2009
Author(s)
Iseult Lynch, Hans Bouwmeester, Hans Marvin, Alan Casey, Gordon Chambers, Markus Berges, Martin Clift, Teresa Fernandes, Lise Fjellsbo, Lucienne Juillerat, Gert Roebben, Christoph Klein, Qinglan Wu, Vincent A. Hackley, Jean-Pierre Kaiser, Wolfgang Kreyling, C. Michael Garner, Peter Hatto, Kenneth Dawson, Michael Riediker
This report presents the outcome of the discussions of 60 experts in the field of safety assessment of manufactured NMs from academia, industry, government and non-profit organizations on some of the critical issues pertaining to the development of

Exchanging Technical Product Data, The Story of ISO TC 184/SC4

June 1, 2005
Author(s)
Sharon J. Kemmerer
Developing exchange standards for technical product data started historically as multiple, and isolated, national efforts in the 1970s and early 80s. The industrial domain leading the way in the 70s was primarily the transportation sector (automotive and

Atmospheric Pressure Microplasmas for Modifying Sealed Microfluidic Devices

March 8, 2004
Author(s)
J K. Evju, P B. Howell, Laurie E. Locascio, Michael J. Tarlov, J J. Hickman
A new DC microdischarge technique for chemical modification of microchannel walls is reported. Our results show that strongly hydrophilic or hydrophobic properties are quickly imparted unto the walls of assembled polymer microchannels in atmospheric

Ferrite Ceramics at Microwave Frequencies

January 1, 2001
Author(s)
Richard G. Geyer
Ferrite ceramics are widely used in microwave devices to control transmission path, frequency, amplitude, and phase of microwave signals. Accurate dielectric and magnetic property measurements at the operational frequency and temperature ranges are needed
Displaying 2751 - 2775 of 4212
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