March 27, 2007
Author(s)
K Fahy, E Sokell, G O'Sullivan, A Aguilar, Joshua M. Pomeroy, Joseph N. Tan, John D. Gillaspy
… At the NIST Electron Beam Ion Trap (EBIT), extreme-ultraviolet spectra of xenon ions have been recorded using a flat-field spectrometer. The … clectron beam ion trap, Cowan code, EUV, extreme ultraviolet, highly charge ions, multiply charged ions, spectroscopy, Xenon …