EUV Spectroscopy of Highly Charged Xenon Ions Created Using an Electron Beam Ion Trap
K Fahy, E Sokell, G O'Sullivan, A Aguilar, Joshua M. Pomeroy, Joseph N. Tan, John D. Gillaspy
At the NIST Electron Beam Ion Trap (EBIT), extreme-ultraviolet spectra of xenon ions have been recorded using a flat-field spectrometer. The electron beam energy was varied from 180 eV to 8 keV and radiation from charge states Xe6+ to Xe43+ was observed. Our measured wavelengths were compared to atomic structure calculations using the Cowan suite of codes. We have measured fourteen previously unreported lines corresponding to transitions in Xe37+ through to Xe41+ with estimated wavelength uncertainties of 0.003 nm. We found that for the case of continuous injection of neutral xenon gas a wide range of charge states were always present in the trap but this charge state distribution was greatly narrowed if a sufficiently low gas injection pressure was employed.
Physical Review A (Atomic, Molecular and Optical Physics)
, Sokell, E.
, O'Sullivan, G.
, Aguilar, A.
, Pomeroy, J.
, Tan, J.
and Gillaspy, J.
EUV Spectroscopy of Highly Charged Xenon Ions Created Using an Electron Beam Ion Trap, Physical Review A (Atomic, Molecular and Optical Physics)
(Accessed December 4, 2023)