EUV Spectroscopy of Highly Charged Xenon Ions Created Using an Electron Beam Ion Trap

Published

March 27, 2007

Author(s)

K Fahy, E Sokell, G O'Sullivan, A Aguilar, Joshua M. Pomeroy, Joseph N. Tan, John D. Gillaspy

Abstract

At the NIST Electron Beam Ion Trap (EBIT), extreme-ultraviolet spectra of xenon ions have been recorded using a flat-field spectrometer. The electron beam energy was varied from 180 eV to 8 keV and radiation from charge states Xe6+ to Xe43+ was observed. Our measured wavelengths were compared to atomic structure calculations using the Cowan suite of codes. We have measured fourteen previously unreported lines corresponding to transitions in Xe37+ through to Xe41+ with estimated wavelength uncertainties of 0.003 nm. We found that for the case of continuous injection of neutral xenon gas a wide range of charge states were always present in the trap but this charge state distribution was greatly narrowed if a sufficiently low gas injection pressure was employed.

Citation

Physical Review A (Atomic, Molecular and Optical Physics)

Volume

75

Issue

3

Pub Type

Journals

Keywords

clectron beam ion trap, Cowan code, EUV, extreme ultraviolet, highly charge ions, multiply charged ions, spectroscopy, Xenon

Citation

Fahy, K. , Sokell, E. , O'Sullivan, G. , Aguilar, A. , Pomeroy, J. , Tan, J. and Gillaspy, J. (2007), EUV Spectroscopy of Highly Charged Xenon Ions Created Using an Electron Beam Ion Trap, Physical Review A (Atomic, Molecular and Optical Physics) (Accessed October 7, 2025)