NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Highly Charged Ion Studies at the NIST EBIT

Published

Author(s)

L P. Ratliff, J R. Roberts
Citation
Highly Charged Ion Studies at the NIST EBIT
Publisher Info
Nova Science Publishers Published as Chapter 9 of: Trapping Highly Charged Ions: Fundamentals and Applications, ed. J.D. Gillaspy, Nova Science Publishers,
Pub Type
Books

Keywords

atoms, EBIT, electron beam ion trap, highly charged ions, ions

Citation

Ratliff, L. and Roberts, J. (2001), Highly Charged Ion Studies at the NIST EBIT, Nova Science Publishers Published as Chapter 9 of: Trapping Highly Charged Ions: Fundamentals and Applications, ed. J.D. Gillaspy, Nova Science Publishers, (Accessed October 26, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 2001, Updated February 17, 2017
Was this page helpful?