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Highly Charged Ion Studies at the NIST EBIT

Published

Author(s)

L P. Ratliff, J R. Roberts
Citation
Highly Charged Ion Studies at the NIST EBIT
Publisher Info
Nova Science Publishers Published as Chapter 9 of: Trapping Highly Charged Ions: Fundamentals and Applications, ed. J.D. Gillaspy, Nova Science Publishers,

Keywords

atoms, EBIT, electron beam ion trap, highly charged ions, ions

Citation

Ratliff, L. and Roberts, J. (2001), Highly Charged Ion Studies at the NIST EBIT, Nova Science Publishers Published as Chapter 9 of: Trapping Highly Charged Ions: Fundamentals and Applications, ed. J.D. Gillaspy, Nova Science Publishers, (Accessed May 27, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2001, Updated February 17, 2017