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Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

Published

Author(s)

Kyle McKay, Dustin Hite, Philip D. Kent, Shlomi S. Kotler, Dietrich Leibfried, Daniel Slichter, Andrew C. Wilson, David P. Pappas

Abstract

We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.
Citation
Physical Review A
Volume
104
Issue
5

Keywords

Atomic Physics, Surface Science, Quantum Computing, Trapped-ion sensors, Surface characterization tools, Electric-field noise

Citation

McKay, K. , Hite, D. , Kent, P. , Kotler, S. , Leibfried, D. , Slichter, D. , Wilson, A. and Pappas, D. (2021), Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor, Physical Review A, [online], https://doi.org/10.1103/PhysRevA.104.052610 (Accessed July 5, 2022)
Created November 18, 2021, Updated November 29, 2021