Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor
Kyle McKay, Dustin Hite, Philip D. Kent, Shlomi S. Kotler, Dietrich Leibfried, Daniel Slichter, Andrew C. Wilson, David P. Pappas
We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.
, Hite, D.
, Kent, P.
, Kotler, S.
, Leibfried, D.
, Slichter, D.
, Wilson, A.
and Pappas, D.
Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor, Physical Review A, [online], https://doi.org/10.1103/PhysRevA.104.052610
(Accessed July 5, 2022)