U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 901 - 925 of 3086

Maximizing Information Obtained From Secondary Ion Mass Spectra of Organic Thin Films Using Multivariate Analysis.

July 1, 2004
Author(s)
M S. Wagner, D G. Graham, B D. Ratner, David G. Castner
… Time -of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) can give detailed … molecular depth profiles obtained using an SF 5u+ primary ion beam. The effect of data normalization and scaling on the … Maximizing Information Obtained From Secondary Ion Mass Spectra of Organic Thin Films Using Multivariate …

Characterization of Emerging Ambient Pressure Mass Spectrometric Techniques using Time-of-Flight Secondary Ion Mass Spectrometry

March 28, 2014
Author(s)
Shinichiro Muramoto, Thomas P. Forbes, Matthew E. Staymates, John G. Gillen
… Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to characterize the … angles also corresponded with higher relative secondary ion yields as measured by ambient MS and ToF-SIMS. For LTP, a … oblique angles corresponded with higher relative secondary ion yields, although the analyte did not display a distinct …

Alloy Selection

October 16, 2008
Author(s)
C A. Handwerker, Ursula R. Kattner, Kil-Won Moon, J Bath, E -. Bradley, P Snugovsky
… the key results and analyses leading to the choice of tin-silver-copper alloys by NEMI as the new national standard …

Application of Inkjet Printing Technology to Produce Test Materials of 1,3,5-Trinitro-1,3,5 Triazcyclohexane for Trace Explosive Analysis

October 15, 2010
Author(s)
Eric S. Windsor, Marcela N. Najarro, Anna N. Bloom, Bruce A. Benner Jr, Robert A. Fletcher, John G. Gillen, Richard Lareau, Inho Cho, Mike Boldmand
… and jetted onto substrates suitable for calibration of the ion mobility spectrometry (IMS) instruments currently … explosives, inkjet printing, ion mobility spectrometry, trace explosives detection …

Microwaves in Quantum Computing

January 29, 2021
Author(s)
Joseph C. Bardin, Daniel Slichter, David J. Reilly
… three leading quantum computing platforms: trapped atomic ion qubits, spin qubits in semiconductors, and …
Displaying 901 - 925 of 3086
Was this page helpful?