Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

X-Ray Spectroscopy of Highly Charged Ions in Laboratory and Astrophysical Plasmas

Published

Author(s)

E. H. Silver, N Brickhouse, T. Lin, G X. Chen, K. Kirby, John D. Gillaspy, Joseph N. Tan, J M. Laming

Abstract

This paper presents (1) new laboratory data on the x-ray spectra of He-like Ar XVII over a broad spectral range (300-3500 eV) at high resolution (2) the results of new measurements of K-shell x- ray reference lines in carbon, oxygen, iron, copper, and aluminum which were then used to obtain an absolute calibration of our x-ray microcalorimeter efficiency function, and (3) a review of our laboratory astrophysics research program. The data will be used to improve our laboratory measurements of Ne-like Fe XVII which, together with the new argon data presented here are useful for interpreting observations from NASA's orbiting Chandra X-ray Observatory.
Proceedings Title
Proceedings of the International Conference on Recent Advances in Spectroscopy: Theoretical, Astrophysical, and Experimental Perspectives
Conference Dates
January 28-31, 2009
Conference Location
Kodaikanal, IN

Keywords

K-shell X rays, atomic spectroscopy, microcalorimeter, heliumlike argon XVII, neonlike iron XVII, efficiency calibration, electron beam ion trap (EBIT)

Citation

Silver, E. , Brickhouse, N. , Lin, T. , Chen, G. , Kirby, K. , Gillaspy, J. , Tan, J. and Laming, J. (2010), X-Ray Spectroscopy of Highly Charged Ions in Laboratory and Astrophysical Plasmas, Proceedings of the International Conference on Recent Advances in Spectroscopy: Theoretical, Astrophysical, and Experimental Perspectives, Kodaikanal, IN (Accessed May 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 31, 2010, Updated October 12, 2021