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Search Publications

NIST Authors in Bold

Displaying 1201 - 1225 of 2915

Dynamic Error Correction of a Digitizer for Time Domain Metrology

February 1, 2003
Author(s)
David I. Bergman
A method for numerical correction of distortion in a digitizer used for metrology applications is described. Investigation of the digitizer's error behavior in the phase plane leads to the development of an analytic error model that describes the digitizer

High-Resolution Infrared Spectrum of the Ring-Puckering Band, N 10 of Diborane

June 1, 2000
Author(s)
Walter J. Lafferty, J.- M. Flaud, R L. Sams, Thomas A. Blake, S W. Sharpe
The spectrum of the Ņ 10 band of diborane, arising from the ring puckering vibration, has been obtained with a spectral resolution of 0.0015 cm -1 in the region 275 to 400 cm -1. The spectrum of a sample enriched in 10B was recorded as well as one with

Engineering Intelligent Systems

September 1, 1998
Author(s)
James S. Albus
What is intelligence? Where did it come from? What is its fundamental nature? What are its elemental constituents? Can it be created artificially? If so how? The answers to these questions are beginning to emerge. As the second millennium draws to a close

Fire Hazards of Dry Versus Watered Christmas Trees

December 15, 2020
Author(s)
Matthew S. Hoehler, Matthew F. Bundy, Laurean A. DeLauter, Robin L. Materese, Leon Gerskovic, Jose R. Garcia
… a book of matches with the match heads wrapped with a thin nickel- chromium wire that heats, igniting the matchbook, …

Electrical Measurements for Electronic Interconnections at NIST

August 1, 1999
Author(s)
Dylan Williams, Donald C. DeGroot
The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, the

Effects of Nonlinear Diode Junction Capacitance on the Nose-to-Nose Calibration

May 1, 2001
Author(s)
Kate Remley, Dylan Williams, Donald C. DeGroot, Jan Verspecht, John Kerley
We examine the effects of nonlinear diode junction capacitance on the fundamental premise of the noise-to-nose calibration, that the kickout is identical in shape to the impulse response of the sampler. We offer a physical explanation for the error

Stress and Strain Heuristics for a Layered Elastomeric Foam at Medium Impact Rates

September 14, 2020
Author(s)
Alexander Landauer, Jared C. Van Blitterswyk, Michael Riley, Aaron Forster
Impact mitigating materials (IMMs) are used to reduce injury or damage due to a blunt impact, which often occurs at high rates or energies. Innovation in IMMs and designs strategies are required for the development of safer protective equipment. A key

Time-of-flight mass spectrometry with latching Nb meander detectors

June 1, 2009
Author(s)
Brian Estey, James A. Beall, Gene C. Hilton, Kent D. Irwin, Daniel R. Schmidt, Joel N. Ullom, Robert E. Schwall
Mass Spectrometry is widely used for protein characterization, structural virology, drug discovery, and clinical chemistry. However the detection efficiency of existing detectors for mass spectrometry degrades rapidly as mass is increased and is only ~10-5

Combinatorial Polymer Scaffold Libraries

November 1, 2007
Author(s)
Carl G. Simon Jr., J S. Stephens, Matthew Becker
We have developed a method for fabricating combinatorial libraries of porous, three-dimensional, salt-leached, polymer scaffolds that can be used for screening the effect of scaffold properties on cell response. Syringe pumps, tubing and a static mixer are
Displaying 1201 - 1225 of 2915
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