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Dynamic Error Correction of a Digitizer for Time Domain Metrology

Published

Author(s)

David I. Bergman

Abstract

A method for numerical correction of distortion in a digitizer used for metrology applications is described. Investigation of the digitizer's error behavior in the phase plane leads to the development of an analytic error model that describes the digitizer's distortion behavior. Of particular significance is the model's ability to describe nonlinear error in the fundamental spectral component manifest as amplitude and frequency-dependent gain and phase error. When fitted only to the harmonic distortion content of the digitizer's output data, the model generates an amount of fundamental that correctly accounts for the error in the digitizer's gain that is not due to linear system response. The model is therefore able to improve not just the total harmonic distortion (THD) performance of the digitizer but its ac rms measurement accuracy as well. At 1MHz, the model linearizes the digitizer to 70mV/V over a range of 1 V to 8 V and reduces harmonic distortion by >20 dB. It is believed that this is the first time that results of this nature have been reported in the literature.
Citation
None

Keywords

analog-to-digital converter, error model, phase plane, sine fit

Citation

Bergman, D. (2003), Dynamic Error Correction of a Digitizer for Time Domain Metrology, None, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31305 (Accessed June 21, 2024)

Issues

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Created February 1, 2003, Updated January 27, 2020