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Powder Thermal Conductivity Measurements in L-PBF using Powder-Included Build Specimens: Internal Geometry Effect

September 3, 2020

Author(s)

Shanshan Zhang, Brandon Lane, Kevin Chou

… ranges from 0.67 W/(m∙K) to 1.34 W/(m∙K) at 100 °C to 500 °C, and varies with the internal geometry of the …

Comparison of Bidirectional Transmission Distribution Function (BTDF) Measurements on Fused Silica and Sintered Polytetrafluoroethylene Diffusers

October 21, 2019

Author(s)

Catherine C. Cooksey, James J. Butler, Georgi T. Georgiev

… (STARR) facility on two transmissive diffuse samples: HOD-500*, a synthetic fused silica sample manufactured by Hereaus …

An Investigation into Metallic Powder Thermal Conductivity in Laser Powder Bed Fusion Additive Manufacturing

November 6, 2018

Author(s)

Shanshan Zhang, Brandon Lane, Justin G. Whiting, Kevin Chou

… ranges from 0.65 W/(m∙K) to 1.02 W/(m∙K) at 100 °C and 500 °C, respectively. On the other hand, Ti-6Al-4V powder has … not much different between the two materials, about 4 % to 7 %, which is largely temperature independent. …

Multimodal Characterization of the Morphology and Functional Interfaces in Composite Electrodes for Li-S Batteries by Li Ion and Electron Beams

June 15, 2017

Author(s)

Vladimir P. Oleshko

… capacities >1000 mAh/g and long cycling lifetimes >500 cycles. Hierarchical morphologies and interfacial …

Lattice Parameter Misfit Evolution During Creep of a Co-based Superalloy Single Crystal with Cuboidal and Rafted g' Microstructures

June 13, 2017

Author(s)

James Coakley, Eric Lass, Dong Ma, Matthew Frost, Howard Stone, David N. Seidman, David C. Dunand

… were performed with in-situ neutron diﬀraction at 800 ◦C/500 MPa on this initially rafted γ' microstructure, and for …

Embedding X.509 Digital Certificates in Three-Dimensional Models for Authentication, Authorization, and Traceability of Product Data

July 14, 2016

Author(s)

Thomas D. Hedberg, Sylvere I. Krima, Jaime A. Camelio

… intended as the authentication framework for the X.500 series for electronic directory services, the X.509 …

State-of-the-Art RF Signal Generation From Optical Frequency Division

September 2, 2013

Author(s)

Archita Hati, Craig W. Nelson, Corey A. Barnes, Danielle G. Lirette, Tara M. Fortier, Franklyn J. Quinlan, Jason A. DeSalvo, Andrew D. Ludlow, Till P. Rosenband, Scott A. Diddams, David A. Howe

… corresponds to a frequency stability of approximately 7.6 x 10 -15 at 1 s averaging time for a measurement bandwidth (BW) of 500 Hz, and the integrated timing jitter over 100 kHz BW is …

Observation of the Planar Nernst Effect in Permalloy and Nickel Thin Films with In-Plane Thermal Gradients

November 7, 2012

Author(s)

Matthew R. Pufall, Azure Avery, Barry L. Zink

… Samples of 20 nm thick Ni and Ni80-Fe20 were deposited on 500 nm thick suspended Si-N thermal isolation platforms with …

Fire Exposures of Fire Fighter Self-Contained Breathing Apparatus Facepiece Lenses

November 29, 2011

Author(s)

Amy E. Mensch, George G. Cajaty Barbosa Braga, Nelson P. Bryner

… minutes and produced ceiling temperatures of approximately 500 °C (932 °F) to 750 °C (1382 °F) in the room adjacent to …

A Combinatorial Study of Thin Film Process Variables Using Microhotplates

February 17, 2010

Author(s)

David L. Lahr, Joshua L. Hertz, Stephen Semancik

… films were deposited on the microhotplates at 375 °C or 500 °C, with pulsed or continuous heating, and with voltage …

Thermodynamic properties of 1,2-dihydronaphthalene: glassy crystals and missing entropy

May 1, 2008

Author(s)

Robert D. Chirico, William Steele

… derived at selected temperatures between T = 250 K and 500 K. The standard state is defined as the ideal gas at the …

Comparison of Optical and Stylus Methods for Measurement of Rough Surfaces

January 1, 2007

Author(s)

Theodore V. Vorburger, H G. Rhee, Thomas B. Renegar, Jun-Feng Song, Xiaoyu A. Zheng

… profiler instruments. For moderately rough surfaces (Ra::::500 nm), roughness measurements obtained with white light …

Is There a High Energy Particle Population in the Quiet Solar Corona?

December 6, 2006

Author(s)

Yuri Ralchenko, Uri Feldman, G. A. Doschek

… quiet solar corona measurements if more than 3% of a Te=500 eV plasma or more than 1% of a Te=1000 eV plasma is added …

An Empirical Study of Sample Size in ROC-Curve Analysis of Fingerprint Data

December 4, 2006

Author(s)

Jin Chu Wu, Charles Wilson

… intervals of using these two criteria based on 500 Monte Carlo iterations are computed for different sample …

Effect of Xenon Bombardment on Ruthenium-Coated Grazing Incidence Collector Mirror Lifetime for EUV Lithography

September 1, 2006

Author(s)

M Nieto, J P. Allain, V Titov, M R. Hendricks, A Hassanein, D Rokusek, C Chrobak, Charles Tarrio, Yaniv Barad, Steven Grantham, Thomas B. Lucatorto, Bryan Rice

… that unity sputtering is reached at Xe+ energies near 400-500 eV. The Xe+-induced sputter yield decreases an order of …

Electron Beam Metrology of 193 nm Resists at Ultra Low Voltage

May 1, 2003

Author(s)

N. Sullivan, Ronald G. Dixson, B Bunday, M Mastovich, P Knutruda, P Fabre, R Brandoma

… CD features expreience line slimming greater than 5 nm, at 500 eV landing energy during the initial measurement pass, …

Transition From E to H Mode Discharge in Pulse-Modulated Inductively Coupled Plasmas

March 1, 2003

Author(s)

M Edamura, Eric C. Benck

… Pa, a radio-frequency power of 200 W, a pulse frequency of 500 Hz, and an RF-off time of 100 ms), a plasma transits from …

Large Area, Ultra-high Voltage 4H-SiC PiN Rectifiers

December 1, 2002

Author(s)

Ranbir Singh, Kenneth G. Irvine, D C. Capell, James Richmond, David W. Berning, Allen R. Hefner Jr., John W. Palmour

… a forward voltage drop of less than 5 V was observed at 500 A/cm 2 in the 25 0 C to 225 0 C temperature range, and …

Damage Testing of Partial Reflectors for 157 nm Laser Calorimeters

January 1, 2002

Author(s)

Holger Laabs, Richard D. Jones, Christopher L. Cromer, Marla L. Dowell, V. Liberman

… surface changes were observed at these does levels after 500 million pulses, corresponding to a projected calorimeter …

Corrosion Behavior of Weldable Fe-Al Alloys in Oxidizing-Sulfidizing Environments

January 1, 2001

Author(s)

Stephen W. Banovic, J N. DuPont, A R. Marder

… content (from 0 wt % Al to 12.5 wt % Al) and temperature (500 degrees C to 700 degrees C). …

The 1.30 Angstrom Resolution Structure of Bascillus Subtillis Chorismate Mutase Catalytic Homotrimer

June 1, 2000

Author(s)

Jane E. Ladner, Prasad T. Reddy, A M. Davis, M Tordova, A Howard, G L. Gilliland

… structure [Chook et al. (1994) J. Mol. Biol. 240, 476-500] was used as the starting model. The final coordinates …

Process Diagnostics and Thickness Metrology Using in Situ Mass Spectrometry for the Chemical Vapor Deposition of W from H 2 /WF 6

May 1, 2000

Author(s)

T Gougousi, Y Xu, J N. Kidder, G W. Rubloff, Charles R. Tilford

… pressure, and for wafer temperatures ranging from 400 C to 500 C. A relatively fast response time ([approximately equal … to within an uncertainty of [approximately equal to] 7 %. This provides the basis for real-time, non-invasive …