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Displaying 701 - 725 of 762

Anomalies Observed in Wafer Level Microwave Testing

July 10, 1991
Author(s)
Dylan F. Williams, Roger Marks, T H. Miers, A Cangellaris
Two anomalies have been observed in the course of developing planar wafer level standards for the testing of GaAs monolithic microwave integrated circuits. The first involves a low-frequency characteristic impedance change of microstrip and coplanar

Growth and properties of YBa2Cu3O7 thin films on vicinal and polycrystalline MgO substrates

December 21, 1990
Author(s)
Stephen E. Russek, Brian H. Moeckly, D. K. Lathrop, R A. Buhrman, M. G. Norton, C, B. Carter
We discuss the results of a study on the growth by laser ablation of YBa2Cu3O7 thin films on polycrystalline and annealed vicinal (001) MgO substrates. In both instances the filss were found to grow predominantly with the c axis normal the the plane of the

Growth of YBa2Cu3O7 thin films on MgO: the effect of substrate preparation

October 30, 1990
Author(s)
Stephen E. Russek, Brian H. Moeckly, D. K. Lathrop, R A. Buhrman, Jian Li, J. W. Mayer
We discuss the results of a study on growth by laser ablation of YBa2CuO7 thin films on polycrystalline and annealed vicinal (001) MgO substrates. In both instances the films were found to grow predominantly with c axis normal to the plane of the substrate

Growth of YBa2Cu3O7 thin films on MgO: the effect of substrate preparation

August 13, 1990
Author(s)
Stephen E. Russek
We discuss the results of a study of the effect of a substrate preparation on the microstructure and superconductive properties of YBa2Cu3O7 think films formed by laser ablation on (001) MgO substrates. Thermal annealing of the substrates is found to be
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