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Standards

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Displaying 676 - 700 of 842

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

February 1, 2010
Author(s)
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materials needed by the

NIST HB 105-4, Specifications and Tolerances for Reference Standards and Field Standard Weights and Measures 4. Specifications and Tolerances for Liquefied Petroleum Gas and Anhydrous Ammonia Pressurized Volumetic Field Standards

February 1, 2010
Author(s)
Georgia L. Harris, L.F. Eason
These specifications and tolerances are recommended as minimum requirements for standards used by state and local weights and measures officials and others in the regulatory verification of meters used in quantity determination of pressurized liquid

NIST HB 105-3, Specifications and Tolerances for Reference Standards and Field Standard Weights and Measures, 3. Specifications and Tolerances for Graduated Neck Type Volumetric Field Standards

January 31, 2010
Author(s)
Georgia L. Harris, L.F. Eason
These specifications and tolerances are recommended as minimum requirements for standards used by state and local weights and measures officials and others in the regulatory verification of meters used in quantity determination of liquid commodities. Other

SRM NIST Standard Reference Materials Catalog, January 2010

January 4, 2010
Author(s)
Regina R. Montgomery, Joan C. Sauerwein
NIST Standard Reference Materials (SRMs) are used by industry, government, and academia to ensure the highest quality measurements. This catalog lists over 1100 individual reference materials produced and sold by NIST, each with carefully assigned values

Optical high-power nonlinearity comparison between the National Institute of Standards and Technology and the National Metrology Institute of Japan at 1480 nm

December 23, 2009
Author(s)
Igor Vayshenker, Shao Yang, Kuniaki Amemiya, Seiji Mukai, T. Zama
We compare the results of measurements of the nonlinearity of high-power optical fiber powermeters (OFPMs) by two national metrology institutes (NMIs): the National Institute of Standards and Technology (NIST-USA) and the National Metrology Institute of

Long-term comparison of caesium fountain primary frequency standards

December 7, 2009
Author(s)
Thomas E. Parker
There are currently nine caesium fountain primary frequency standards regularly reporting calibrations of International Atomic Time to the Bureau International des Poids et Measures (BIPM). An investigation has been carried out using data from the BIPM

Optimizing Acoustic Measurements of the Boltzmann Constant

November 22, 2009
Author(s)
Michael R. Moldover
We review the progress in acoustic metrology of gases that has occurred since the 1988 measurement of the universal gas constant R using a spherical acoustic resonator. The advances in understanding resonators and in calculating the thermophysical

Chemical Science and Technology Laboratory (CSTL) 2009 Annual Report

November 17, 2009
Author(s)
Willie E. May, Richard R. Cavanagh, Dianne L. Poster, Michael D. Amos
CSTL is entrusted with building, sustaining, and maximizing the chemical measurement system that is criticial to chemical technological innovation, economic competitiveness and new job growth for the benefit of the Nation.

NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000

October 30, 2009
Author(s)
Donald A. Windover, David L. Gil, Albert Henins, James P. Cline
NIST recently released a standard reference material (SRM) for the calibration of high resolution X-ray diffraction (HRXRD) instruments. HRXRD is extensively used in the characterization of lattice distortion in thin single, epitaxial crystal layers on

TRC Thermodynamic Tables, Hydrocarbon Supplement H-138

October 19, 2009
Author(s)
Michael D. Frenkel
1. Table 23-14-2-(33.35100)-d/Page d-8950: New table for benzothiophenes, C8 to C12, containing density for the condensed phase at one bar, or at equilibrium vapor pressure above the boiling point. 2. Table 23-2-(5.12006)-db/Pages db-2620.0 to 2620.10: New

NIST SRM (Standard Reference Material) 2460/2461 Standard Bullets and Casings Project

October 13, 2009
Author(s)
Jun-Feng Song, Thomas Brian Renegar, Xiaoyu Alan Zheng, Robert M. Thompson, Richard M. Silver, Martin M. Ols, Ted T. Vorburger
The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the Standard Reference Material (SRM) 2460 Bullets and 2461 Cartridge Cases. NIST has also

Quantitative Assessment of Robot-generated Maps

October 8, 2009
Author(s)
Christopher J. Scrapper Jr, Rajmohan Madhavan, Adam S. Jacoff, R Lakaemper, A Censi, Afzal A. Godil, Asim Wagan
Mobile robotic mapping is now considered to be a sufficiently mature field with demonstrated successes in various domains. While there has been much progress made in the development of computationally efficient and consistent mapping schemes, it is still

GEOMETRIC MEASUREMENT COMPARISONS FOR ROCKWELL DIAMOND INDENTERS

September 6, 2009
Author(s)
Jun-Feng Song, Samuel R. Low III, Xiaoyu A. Zheng
In the uncertainty budget of Rockwell C hardness (HRC) tests, geometric error of the Rockwell diamond indenter is a major contributor. The geometric calibration of Rockwell diamond indenters has been a key issue for Rockwell hardness standardization. The

Uncertainty calculation for spectral-responsivity measurements

September 1, 2009
Author(s)
John H. Lehman, Chih-Ming Wang, Marla L. Dowell, Joshua A. Hadler
This paper discusses a procedure for measuring the absolute spectral responsivity of optical-fiber power meters and computation of the calibration uncertainty. The procedure reconciles measurement results associated with a monochromator-based measurement

Reference measurements of Hydrogen's Dielectric Permittivity

August 10, 2009
Author(s)
James W. Schmidt, Michael R. Moldover, Eric F. May
We used a quasi-spherical cavity resonator to measure the relative dielectric permittivity ε r of H 2 at frequencies from 2.4 GHz to 7.3 GHz, at pressures up to 6.5 MPa, and at the temperatures 273 K and 293 K. The resonator was calibrated using auxiliary

High Definition Flow

August 1, 2009
Author(s)
John D. Wright, Michael R. Moldover
From pharmaceutical production to the natural gas market, exact flow measurements are critical. Here's how NIST helps keep us all on the same page.

Towards portable vacuum standards

August 1, 2009
Author(s)
Jay H. Hendricks, Douglas A. Olson
Since the middle of the 17th century, when Italian physicist Evangelista Torricelli discovered that a glass tube filled with mercury could be used to measure atmospheric pressure, liquid-column manometers have been used as a primary standard to measure

Certification Report for SRM 2112 and 2113

July 1, 2009
Author(s)
Christopher N. McCowan
This report documents the procedures used to develop certified maximum force and absorbed energy values for SRM 2112 and SRM 2113. The report serves to provide outside observers with accurate and detailed information on how the materials were certified and

Laboratory Recognition Process for Project 25 Compliance Assessment

June 30, 2009
Author(s)
Kurt Fischer, Andrew P. Thiessen
Project 25 (P25) is a standards development process for the design, manufacture and evaluation of interoperable digital two-way wireless communications products created by and for public safety professionals. The published P25 standards suite is

Test Tool for Industrial Ethernet Network Performance

June 5, 2009
Author(s)
James D. Gilsinn, Freemon Johnson
The number of devices that implement Ethernet interfaces on the factory floor is growing at an exponential rate along with the adoption of industrial-grade Ethernet networks on the plant floor. In addition to the sheer number of devices using industrial

Molar Mass and Related Quantities in the New SI

June 3, 2009
Author(s)
Barry N. Taylor
This Letter addresses the calculation of molar mass and related quantities in the New SI currently under discussion by the International Committee for Weights and Measures and its Consultative Committee for Units and which could be adopted by the next
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