Jarrett, D.
and Dupree, A.
(2010),
NEXT GENERATION GUARDED HAMON TRANSFER STANDARDS FOR HIGH RESISTANCE, 2010 Conference on Precision Electromagnetic Measurements Conference Digest, Daejeon, -1
(Accessed July 2, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
NEXT GENERATION GUARDED HAMON TRANSFER STANDARDS FOR HIGH RESISTANCE
Published
Author(s)
, Andrew J. Dupree
Abstract
Guarded Hamon transfer standards have been used at NIST for decades for scaling to high resistance levels. A recent project has been undertaken to apply improved designs in guarded Hamon transfer standards to the 1 MΩ to 100 MΩ ranges with the larger goal of applying these experimental guarding and construction techniques to guarded Hamon transfer standards in the 100 GΩ to 100 TΩ ranges in the future. A guarded backbone structure, elimination of charge-storing materials in the connections, and hermetically sealing all the elements in one canister are the key features of this new design of transfer standards.Proceedings Title
2010 Conference on Precision Electromagnetic Measurements Conference Digest
Volume
978-1-4244-6794-5/10
Conference Dates
June 13-18, 2010
Conference Location
Daejeon
Conference Title
2010 Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
Keywords
standard resistor, high resistance, leakage current, guard circuit, measurement
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created May 1, 2010, Updated February 19, 2017