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PUBLICATIONS

NEXT GENERATION GUARDED HAMON TRANSFER STANDARDS FOR HIGH RESISTANCE

Published

Author(s)

Dean G. Jarrett, Andrew J. Dupree

Abstract

Guarded Hamon transfer standards have been used at NIST for decades for scaling to high resistance levels. A recent project has been undertaken to apply improved designs in guarded Hamon transfer standards to the 1 MΩ to 100 MΩ ranges with the larger goal of applying these experimental guarding and construction techniques to guarded Hamon transfer standards in the 100 GΩ to 100 TΩ ranges in the future. A guarded backbone structure, elimination of charge-storing materials in the connections, and hermetically sealing all the elements in one canister are the key features of this new design of transfer standards.
Proceedings Title
2010 Conference on Precision Electromagnetic Measurements Conference Digest
Volume
978-1-4244-6794-5/10
Conference Dates
June 13-18, 2010
Conference Location
Daejeon
Conference Title
2010 Conference on Precision Electromagnetic Measurements
Pub Type
Conferences

Keywords

standard resistor, high resistance, leakage current, guard circuit, measurement
Metrology and Standards

Citation

Jarrett, D. and Dupree, A. (2010), NEXT GENERATION GUARDED HAMON TRANSFER STANDARDS FOR HIGH RESISTANCE, 2010 Conference on Precision Electromagnetic Measurements Conference Digest, Daejeon, -1 (Accessed May 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 1, 2010, Updated February 19, 2017