Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

NEXT GENERATION GUARDED HAMON TRANSFER STANDARDS FOR HIGH RESISTANCE

Published

Author(s)

Dean G. Jarrett, Andrew J. Dupree

Abstract

Guarded Hamon transfer standards have been used at NIST for decades for scaling to high resistance levels. A recent project has been undertaken to apply improved designs in guarded Hamon transfer standards to the 1 MΩ to 100 MΩ ranges with the larger goal of applying these experimental guarding and construction techniques to guarded Hamon transfer standards in the 100 GΩ to 100 TΩ ranges in the future. A guarded backbone structure, elimination of charge-storing materials in the connections, and hermetically sealing all the elements in one canister are the key features of this new design of transfer standards.
Proceedings Title
2010 Conference on Precision Electromagnetic Measurements Conference Digest
Volume
978-1-4244-6794-5/10
Conference Dates
June 13-18, 2010
Conference Location
Daejeon
Conference Title
2010 Conference on Precision Electromagnetic Measurements

Keywords

standard resistor, high resistance, leakage current, guard circuit, measurement

Citation

Jarrett, D. and Dupree, A. (2010), NEXT GENERATION GUARDED HAMON TRANSFER STANDARDS FOR HIGH RESISTANCE, 2010 Conference on Precision Electromagnetic Measurements Conference Digest, Daejeon, -1 (Accessed April 20, 2024)
Created May 1, 2010, Updated February 19, 2017