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Physics

Spectroscopy

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Displaying 851 - 875 of 899

Embracing Uncertainty: Modeling Uncertainty in EPMA - Part II

January 1, 2001
Author(s)
Nicholas Ritchie
This, the second in a series of articles present a new framework for considering the computation of uncertainty in electron excited X-ray microanalysis measurements, will discuss matrix correction. The framework presented in the first article will be

Sum Frequency Spectroscopy Studies of Adsorption of Additives on Metal/Electrolyte Interfaces

November 1, 2000
Author(s)
Clayton S. Yang, Lee J. Richter, Kimberly Briggman, John C. Stephenson, Thomas P. Moffat, Gery R. Stafford
In situ and ex situ VR-SFG studies of mercaptopropylsulfonate (MPSA) molecules adsorbed on metal/electrolyte interfaces prove the molecular conformation is sensitive to hydration. MPSA catalyses electrodeposition of copper interconnection for semiconductor

NIST Data Resources for X-Ray Photoelectron Spectroscopy

October 1, 2000
Author(s)
Cedric J. Powell
A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an Elastic

CIE Fundamentals for Color Measurements

September 30, 2000
Author(s)
Yoshi Ohno
The paper first overviews the CIE system of colorimetry, covering CIE 1931 color matching functions, XYZ tristimulus values, the x, y diagram, the 1976 u', v' diagram, and the evolvement of CIELUV and CIELAB color spaces and color difference formulae. The

Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy

September 1, 2000
Author(s)
Chris A. Michaels, C E. Dentinger, Lee J. Richter, D B. Chase, Richard R. Cavanagh, Stephan J. Stranick
Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface

Laboratory Astrophysics Survey of Key X-Ray Diagnostic Lines Using a Microcalorimeter on an Electron Beam Ion Trap

September 1, 2000
Author(s)
E Silver, H. Schnopper, Simon R. Bandler, N Brickhouse, S Murray, M Barbera, E Takacs, John D. Gillaspy, James V. Porto, I Kink, J M. Laming, N. Madden, D Landis, J. Beeman, E. E. Haller
Cosmic plasma conditions created in an Electron Beam Ion Trap (EBIT) make it possible to simulate the dependencies of Key diagnostic x-ray lines on density, temperature, and excitation conditions that exist in astrophysical sources. We used a

Fast Imaging of Hard X-Rays With a Laboratory Microscope

July 1, 2000
Author(s)
A S. Bakulin, S M. Durbin, Terrence J. Jach, J Pedulla
An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural investigations of materials with hard x-rays. It uses the Kirkpatrick-Baez multilayer mirror design to form

Excited States at Surfaces: Fano Profiles in STM Spectroscopy of Adsorbates

March 1, 2000
Author(s)
John William Gadzuk, M Plihal
The Fano-Anderson model for a discrete state embedded within a continuum is revisited within the context of excitation and decay processes which lead to some manifestations of Fano lineshape profiles. The phenomenon of resonance tunneling between an STM

Raman Intensity Calibration With Glass Luminescence Standards

January 1, 2000
Author(s)
E S. Etz, Wilbur S. Hurst, Steven J. Choquette
This Paper describes the NIST development of standards and procedures for the calibration of the Raman Spectral Intensity. The work is based on the NIST proposal of the use of luminescent glass standards for the transfer of the white light calibration to

Dynamical Diffraction and X-Ray Standing Waves from Atomic Planes Normal in a Twofold Symmetry Axis of the Quasicrystal A1PdMn

April 1, 1999
Author(s)
Terrence J. Jach, Yanbao Zhang, R. Colella, M. De Boissieu, M. Boudard, A. I. Goldman, T Lograsso, D W. Delaney, S. Kycia
We have observed dynamical diffraction in the [024024] and[046046] reflections of the icosahedral quasicrystal A1PdMn in the back-reflection geometry (θ B = 90 ). The x-ray fluorescence from the Al and Pd atoms exhibits strong standing wave behavior

Vibrationally-Resolved Sum-Frequency Generation With Broad Bandwidth Infrared Pulses

October 15, 1998
Author(s)
Lee J. Richter, T Petralli-Mallow, John C. Stephenson
We present a novel procedure for vibrationally-resolved sum-frequency generation (SFG) in which a broad-bandwidth IR pulse is mixed with a narrow-bandwidth visible pulse. The resultant SFG spectrum is dispersed with a spectrograph and detected in parallel
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