Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Comparison of Optical Coherence Tomography, X-Ray Computed Tomography, and Confocal Microscopy Results From an Impact Damaged Epoxy/E-Glass Composite

Published

Author(s)

Joy Dunkers, D P. Sanders, Donald L. Hunston, M J. Everett, William H. Green

Abstract

Optical coherence tomography (OCT) is an emerging technique for imaging of synthetic materials. OCT is attractive because of the combination of its high sensitivity (>90 dB), high resolution ((10-20) mm), and low cost ($75 k). The value of any new technology is evaluated by how well it compares with existing ones. In this work, impact damage of an epoxy/E-glass composite is imaged using OCT. The results were compared with micro-focus x-ray computed tomography, which is considered to be the benchmark to which OCT is measured because of its ability to locate features precisely with a comparable resolution. OCT is considered to be a confocal technique and was compared to an analogous technique, laser scanning confocal microscopy. Contrast mechanisms, sensitivity, resolution, depth of penetration, and artifacts between the techniques are compared and contrasted. Also, damage mechanisms revealed using OCT are briefly discussed.
Citation
Ndt & E International
Volume
78 No. 2

Keywords

composites, confocal microscopy, damage, non-destructive evaluation, optical coherence tomography, x-ray tomography

Citation

Dunkers, J. , Sanders, D. , Hunston, D. , Everett, M. and Green, W. (2002), Comparison of Optical Coherence Tomography, X-Ray Computed Tomography, and Confocal Microscopy Results From an Impact Damaged Epoxy/E-Glass Composite, Ndt & E International, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851798 (Accessed December 4, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2001, Updated October 12, 2021