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Spectroscopy

News and Updates

Projects and Programs

The Research

Publications

Emerging technologies in the field of thermometry

Author(s)
Zeeshan Ahmed, Graham Machin, Sergey Dedyulin
The past decade saw the emergence of new temperature sensors that have the potential to disrupt a century-old measurement infrastructure based on resistance

Software

Tools and Instruments

Beamline 7: EUV reflectometry

The NIST/DARPA EUV Reflectometry facility began in the late 1980's to make measurements of the reflectivity of EUV multilayer optics for lithography. Since then

Awards

2015 French Award

The Judson C. French Award, first presented in 2000, is granted for significant improvement in products delivered directly to industry

2009 APS Fellow - Yuri Ralchenko

For significant contributions to the relativistic theory of highly-charged ions and collisional-radiative modeling, and through creation of