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Nanotechnology

Nanometrology

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Displaying 776 - 800 of 855

Prototype Cantilevers for AFM Lateral Force Measurement

June 2, 2008
Author(s)
Richard S. Gates, Mark Reitsma
One of the major difficulties in calibrating the lateral forces measured with optical lever Atomic Force Microscopy is in determining the lateral optical lever sensitivity. Novel cantilevers have been designed and fabricated to simplify this measurement

Imaging the interface of epitaxial graphene with silicon carbide via scanning tunneling microscopy

December 14, 2007
Author(s)
Gregory M. Rutter, N Guisinger, Jason Crain, Emily Jarvis, Mark D. Stiles, T Li, P First, Joseph A. Stroscio
The potential for electronics based on graphene, a single layer of sp2-bonded carbon atoms, rests on the ability to fabricate graphene into useful devices. Graphene grown epitaxially on SiC substrates offers an avenue for carbon-based electronics allowing

Development of Ultra-Low Magnetic Field Sensors With Magnetic Tunnel Junctions

October 31, 2007
Author(s)
Philip Pong, John E. Bonevich, William F. Egelhoff Jr.
The discovery of tunneling magnetoresistance (TMR) has enhanced the magnetoresistance (MR) ratio from the giant magnetoresistance (GMR) regime of around 10% to over 400% at room temperature. A combination of magnetic tunnel junctions with high

Tracing Electronic Pathways in Molecules Using Inelastic Tunneling Spectroscopy

September 4, 2007
Author(s)
Alessandro Troisi, J M. Beebe, Laura B. Picraux, Roger D. van Zee, D R. Stewart, M Ratner, James G. Kushmerick
Using inelastic electron tunneling spectroscopy (IETS) to measure the vibronic structure of non-equilibrium molecular transport, aided by a quantitative interpretation scheme based on non-equilibrium Greens function/density functional theory methods, we

Scattering and Interference in Epitaxial Graphene

July 13, 2007
Author(s)
Gregory M. Rutter, Jason Crain, T Li, P First, Joseph A. Stroscio
A single sheet of carbon, graphene, exhibits unexpected electronic properties that arise from quantum state symmetries, which restrict the scattering of its charge carriers. Understanding the role of defects in the transport properties of graphene is

Laser Cooled Atoms as a Focused Ion Beam Source

December 21, 2006
Author(s)
James L. Hanssen, Jabez J. McClelland, E Dakin, M Jacka
The evolving field of nanofabrication demands that more precise fabrication and evaluation tools be developed. We describe a method for creating a high quality focused ion beam with enhanced capabilities using an ion source based on laser-cooled neutral

Using Laser-Cooled Atoms as a Focused Ion Beam Source

December 1, 2006
Author(s)
James L. Hanssen, E Dakin, Jabez J. McClelland, M Jacka
The authors describe a new method for creating a high quality focused ion beam using laser-cooled neutral atoms in a magneto-optical trap as an ion source. They show that this new technique can provide spot resolutions and brightness values that are better

Scanning Tunneling Microscope - Web Page

November 1, 2006
Author(s)
Marilyn E. Jacox, John William Gadzuk
The scanning tunneling microscope [STM] is widely used in both industrial and fundamental research to obtain atomic-scale images of metal surfaces. It provides a three-dimensional profile of the surface which is very useful for characterizing surface

Prototype Cantilevers for SI Traceable NanoNewton Force Calibration

September 20, 2006
Author(s)
Richard S. Gates, Jon R. Pratt
A series of extremely uniform prototype reference cantilevers has been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations of

Prototype Cantilevers for SI-Traceable NanoNewton Force Calibration

September 20, 2006
Author(s)
Richard S. Gates, Jon R. Pratt
A series of extremely uniform prototype reference cantilevers have been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations of

Electronically Induced Atom Motion in Engineered CoCu Nanostructures

August 18, 2006
Author(s)
Joseph A. Stroscio, Francesca M. Tavazza, Jason Crain, Robert Celotta, Anne M. Chaka
We have measured the quantum yield for exciting the motion of a single Co atom in CoCu n linear molecules constructed on a Cu(111) surface. The Co atom switched between two lattice positions during electron excitation from the tip of a scanning tunneling

Electronic Effects in Length Distribution of Atom Chains

April 17, 2006
Author(s)
Jason Crain, Mark D. Stiles, Joseph A. Stroscio, Daniel T. Pierce
Gold deposited on Si(553) leads to self assembly of atomic chains, which are broken into finite segments by atomic defects. Scanning tunneling microscopy is used to investigate the distribution of chain lengths and the correlation between defects

Trapping and Moving Atoms on Surfaces

December 1, 2005
Author(s)
Robert Celotta, Joseph A. Stroscio
We have used a scanning tunneling microscope to laterally reposition a single cobalt atom adsorbed on the (111) face of a copper crystal. We find that the atom follows a complex path determined by the trapping potential of the STM tip, the effects of
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