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PUBLICATIONS

Scanning Tunneling Microscope - Web Page

Published

Author(s)

Marilyn E. Jacox, John William Gadzuk

Abstract

The scanning tunneling microscope [STM] is widely used in both industrial and fundamental research to obtain atomic-scale images of metal surfaces. It provides a three-dimensional profile of the surface which is very useful for characterizing surface roughness, observing surface defects, and determining the size and conformation of molecules and aggregates on the surface. Several other recently developed scanning microscopies also use the scanning technology developed for the STM.
Citation
Electronic Publication
Pub Weblink
https://www.nist.gov/pml/scanning-tunneling-microscope
Pub Type
Websites

Keywords

absorption edge, database, total cross section, World Wide Web, x-ray cross section
Nanometrology and Condensed matter

Citation

Jacox, M. and , J. (2006), Scanning Tunneling Microscope - Web Page, Electronic Publication, [online], https://www.nist.gov/pml/scanning-tunneling-microscope (Accessed April 25, 2024)

Created November 1, 2006, Updated June 14, 2017