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Scanning Tunneling Microscope - Web Page

Published

Author(s)

Marilyn E. Jacox, John William Gadzuk

Abstract

The scanning tunneling microscope [STM] is widely used in both industrial and fundamental research to obtain atomic-scale images of metal surfaces. It provides a three-dimensional profile of the surface which is very useful for characterizing surface roughness, observing surface defects, and determining the size and conformation of molecules and aggregates on the surface. Several other recently developed scanning microscopies also use the scanning technology developed for the STM.
Citation
Electronic Publication

Keywords

absorption edge, database, total cross section, World Wide Web, x-ray cross section

Citation

Jacox, M. and , J. (2006), Scanning Tunneling Microscope - Web Page, Electronic Publication, [online], https://www.nist.gov/pml/scanning-tunneling-microscope (Accessed July 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 1, 2006, Updated June 14, 2017