Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 351 - 375 of 855

New Insights into Subsurface Imaging of Carbon Nanotubes in Polymer Composites via Scanning Electron Microscopy

February 4, 2015
Author(s)
Minhua Zhao, Bin Ming, Jae-Woo Kim, Luke J. Gibbons, Xiaohong Gu, Tinh Nguyen, Cheol Park, Peter T. Lillehei, John S. Villarrubia, Andras Vladar, James A. Liddle
Despite many studies of subsurface imaging of carbon nanotube (CNT)-polymer composites via scanning electron microscopy (SEM), significant controversy exists concerning the imaging depth and contrast mechanisms. We studied CNT-polyimide composites and, by

Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications

January 26, 2015
Author(s)
Justin M. Gorham, Karen E. Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe NMN Stan, Thao M. Nguyen, Richard D. Holbrook, Michael R. Winchester, Robert F. Cook, Robert MacCuspie, Vincent A. Hackley
FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This Strategy

Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si

January 1, 2015
Author(s)
Mark D. Vaudin, William A. Osborn, Lawrence H. Friedman, Justin M. Gorham, Robert F. Cook, Victor Vartanian
Patterned SiGe thin film structures, heteroepitaxially deposited on Si substrates, are investigated as potential reference standards to establish the accuracy of high resolution electron backscattered diffraction (HR-EBSD) strain measurement methods. The

Applicability of post-ionization theory to laser-assisted field evaporation of magnetite

December 18, 2014
Author(s)
Ann C. Chiaramonti Debay, D. K. Schreiber, Lyle M. Gordon, Karen Kruska
Analysis of the mean Fe ion charge state from laser-assisted field evaporation of magnetite (Fe3O4) reveals unexpected trends as a function of laser pulse energy that break from conventional post-ionization theory for metals. For Fe ions evaporated from

193 nm scatterfield microscope illumination optics

December 17, 2014
Author(s)
Martin Y. Sohn, Richard M. Silver
A scatterfield microscope for deep sub-wavelength semiconductor metrology using 193 nm light has been designed. In addition to accommodating the fixed numerical aperture and size of its commercial catadioptric objective lens, the illumination optics are

Nanomanufacturing Metrology for Cellulosic Nanomaterials: an Update

December 1, 2014
Author(s)
Michael T. Postek
The development of the metrology and standards for advanced manufacturing of cellulosic nanomaterials (or basically, wood-based nanotechnology) is imperative to the success of this rising economic sector. Wood-based nanotechnology is a revolutionary

Analytical Ultracentrifugation of Carbon Nanotubes

November 26, 2014
Author(s)
Jeffrey A. Fagan
Sedimentation velocity (SV) experiments on dispersed nanoparticles are a powerful method for determining otherwise hard to evaluate properties of the nanoparticle such as the density and size of the adsorbed interfacial layer, or for a direct evaluation of

Measurement of the Electrostatic Edge Effect in Wurtzite GaN Nanowires

November 24, 2014
Author(s)
Alex Henning, Benjamin Klein, Kristine A. Bertness, Paul T. Blanchard, Norman Sanford, Yossi Rosenwaks
The electrostatic effect of the hexagonal corner on the electronic structure in wurtzite GaN nanowires (NWs) was directly measured using Kelvin probe force microscopy (KPFM). By correlating electrostatic simulations with the measured potential difference

Accurate determination of the size distribution for polydisperse, cationic metallic nanomaterials by asymmetric-flow field flow fractionation

November 13, 2014
Author(s)
Julien C. Gigault, Thao M. Nguyen, John M. Pettibone, Vincent A. Hackley
In this work we have developed and validated a methodology for determining the size distribution in polydisperse cationic nanoparticle (NP) samples using asymmetric-flow field flow fractionation (A4F), where known compositional influence of previously used

Energy Transfer Between Eigenmodes in Multimodal Atomic Force Microscopy

November 5, 2014
Author(s)
Sang M. An, Santiago D. Solares Rivera, Sergio Santos, Daniel Ebeling
We present experimental and computational investigations of tetramodal and pentamodal atomic force microscopy (AFM), respectively, whereby the first four or five flexural modes of the cantilever are simultaneously excited externally. This leads to six to

Direct evidence of active and inactive phases of Fe catalyst nanoparticles for carbon nanotube formation

November 1, 2014
Author(s)
Stefano Mazzuccoo, Ying Wang, Mihaela M. Tanase, Matthieu C. Picher, Kai Li, Zhijian WU, Stephan Irle, Renu Sharma
Iron and carbon interactions play an important role in various industrial processes such as steel manufacturing, liquid fuel the production by Fischer Tropsch process and carbon nanotube synthesis by chemical vapor deposition process. Interestingly, iron

Mechanisms of aging and release from weathered nanocomposites

October 31, 2014
Author(s)
Tinh Nguyen, Wendel Wohlleben, Li Piin Sung
Polymer nanocomposites are increasingly used in outdoor structures. However, polymers are susceptible to degradation by solar ultraviolet (UV) radiation, which potentially releases nanofiller during polymer nanocomposites' life cycle. Such release may pose

Nanoparticle size determination using optical microscopes

October 27, 2014
Author(s)
Ravikiran Attota, Richard J. Kasica, Premsagar P. Kavuri, Hyeong G. Kang, Lei Chen
We present a simple method for size determination of nanoparticles using conventional optical microscopes. The method, called through-focus scanning optical microscopy (TSOM), makes use of the four-dimensional optical information collected at different

3D Monte Carlo modeling of the SEM: Are there applications to photomask metrology?

October 23, 2014
Author(s)
John S. Villarrubia, Andras Vladar, Michael T. Postek
The ability to model the effect of fields due to charges trapped in insulators with floating conductors has been added to JMONSEL (Java Monte Carlo simulator for Secondary Electrons) and applied to a simple photomask metal on glass geometry. These

Nucleation of Graphene and Its Conversion to Single Walled Carbon Nanotube

October 20, 2014
Author(s)
Matthieu C. Picher, Pin A. Lin, Gomez-Ballesteros L. Jose, Perla Balbuena, Renu Sharma
Nucleation is a critical stage for controlling the molecular building blocks into desired functional crystalline structures. For example, chirality of a single-walled carbon nanotube is determined at nucleation stage when the growing graphene sheet wraps

Mechanical property changes in porous low-k dielectric thin films during processing

October 15, 2014
Author(s)
Gheorghe Stan, Richard S. Gates, Premsagar P. Kavuri, Jessica Torres, David Michalak, Canay Ege, Jeff Bielefeld, Sean W. King
The design of future generations of Cu-low-k dielectric interconnects with reduced electronic crosstalk often requires engineering materials with an optimal trade off between their dielectric constant and elastic modulus. This is because the benefits

GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy

September 25, 2014
Author(s)
Joel Weber, Paul T. Blanchard, Aric Sanders, Jonas Gertsch, Steven George, Samuel Berweger, Atif A. Imtiaz, Thomas Mitchell (Mitch) Wallis, Kris A. Bertness, Pavel Kabos, Norman A. Sanford, victor bright
We report on the fabrication of a GaN nanowire probe for near-field scanning microwave microscopy. The probe has a capacitive resolution of 0.03 fF, surpassing that of a commercial Pt tip. Imaging of MoS2 sheets found the probe to be immune to surface
Was this page helpful?