Nanomanufacturing Metrology for Cellulosic Nanomaterials: an Update

Published: December 01, 2014


Michael T. Postek


The development of the metrology and standards for advanced manufacturing of cellulosic nanomaterials (or basically, wood-based nanotechnology) is imperative to the success of this rising economic sector. Wood-based nanotechnology is a revolutionary technology that will create new jobs and strengthen America’s forest-based economy through industrial development and expansion. It allows this, previously perceived, low-tech industry to leap-frog directly into high-tech products and processes and thus improves its current economic slump. Recent global investments in nanotechnology programs have led to a deeper appreciation of the high performance nature of cellulose nanomaterials. Cellulose, manufactured to the smallest possible-size (~2 nm x ~100 nm), is a high-value material that enables products to be lighter and stronger; have less embodied energy; utilize no catalysts in the manufacturing, are biologically compatible and, come from a readily renewable resource. In addition to the potential for a dramatic impact on the national economy – estimated to be as much as $250 billion worldwide by 2020 – cellulose-based nanotechnology creates a pathway for expanded and new markets utilizing these renewable materials. The installed capacity associated with the US Pulp and Paper Industry represents an opportunity, with investment, to rapidly move to large scale production of nano-based materials. However, effective imaging, characterization and fundamental measurement science for process control and characterization are lacking at the present time. This talk will discuss some of these needed measurements and potential solutions.
Proceedings Title: Instrumentation, Metrology and Standards for Nanomanufacturing, Optics,and Semiconductors VIII
Conference Dates: August 17-22, 2014
Conference Location: San Diego, CA
Conference Title: SPIE Optics and Photonics
Pub Type: Conferences

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calibration, cellulose measurements, metrology, scanning electron microscope, SEM, standards, reference material
Created December 01, 2014, Updated February 19, 2017