TY  - CONF
AU  - Michael Postek
C2  - Instrumentation, Metrology and Standards for Nanomanufacturing, Optics,and Semiconductors VIII , San Diego, CA
DA  - 2014-12-01
LA  - en
PB  - Instrumentation, Metrology and Standards for Nanomanufacturing, Optics,and Semiconductors VIII , San Diego, CA
PY  - 2014
TI  - Nanomanufacturing Metrology for Cellulosic Nanomaterials: an Update
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916298
ER  -