Nanoparticle size determination using optical microscopes

Published

October 27, 2014

Author(s)

Ravikiran Attota, Richard Kasica, Premsagar P. Kavuri, Hyeong G. Kang, Lei Chen

Abstract

We present a simple method for size determination of nanoparticles using conventional optical microscopes. The method, called through-focus scanning optical microscopy (TSOM), makes use of the four-dimensional optical information collected at different focus positions. Low partial coherence illumination combined with analysis of through-focus optical content enables nanoparticle size determination with nanometer scale sensitivity. We experimentally demonstrate this using fabricated Si nanodots and spherical gold nanoparticles. The method is economical, as no hardware modifications to conventional optical microscopes are needed. In addition, the method also has high throughput and potential for soft nanoparticle size determination without distortion.

Citation

Applied Physics Letters

Pub Type

Journals

Download Paper

https://doi.org/10.1063/1.4900484

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Keywords

nanoparticles, TSOM, size, optical microscope, nanotechnology

Citation

Attota, R. , Kasica, R. , Kavuri, P. , Kang, H. and Chen, L. (2014), Nanoparticle size determination using optical microscopes, Applied Physics Letters, [online], https://doi.org/10.1063/1.4900484, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914209 (Accessed May 28, 2026)

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