U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Metrology

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 1176 - 1200 of 2730

Writing Guidelines to Develop an Memorandum of Understanding for Interoperable Automated Fingerprint Identification Systems

May 14, 2013
Author(s)
Susan M. Ballou, Michael Garris, Anthony Clay, Joi Dickerson, Peter T. Higgins, Lisa Jackson, Joe Morrissey, Beth Owens, Joe Polski, Janet Hoin, Leo Norton, Melissa Taylor
This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the

High Accuracy Measurements Using a Scanning System with a Single Point Triangulation Sensor

May 13, 2013
Author(s)
Theodore D. Doiron, Wei Ren, Eric S. Stanfield, Balasubramanian Muralikrishnan, Christopher J. Blackburn
The capabilities of non-contact laser spot triangulation sensors for high accuracy measurements have slowly increased over the past decade, and now have usable resolution below 0.1 µm. The Dimensional Metrology Group has developed a simple scanning system

Metrology for Lab-on-a-Chip Final-Product Devices

May 12, 2013
Author(s)
Darwin R. Reyes-Hernandez, Michael W. Halter, Jeeseong Hwang
New metrology tools to measure the critical parameters of internal structures in lab on a chip devices are greatly needed in order to develop standard tests for this technology. Here we present a method that combines a custom made optical coherence

TSV Reveal height and bump dimension metrology by the TSOM method

April 30, 2013
Author(s)
Ravikiran Attota, Haesung Park, Victor H. Vartanian, Ndubuisi G. Orji, Richard A. Allen
Through-focus scanning optical microscopy (TSOM) transforms conventional optical microscopes into truly 3D metrology tools for nanoscale- to- microscale dimensional analysis with nanometer-scale sensitivity. Although not a resolution enhancement method

Use of TSOM for sub-11 nm node pattern defect detection and HAR features

April 30, 2013
Author(s)
Ravikiran Attota, Abraham Arceo, Bunday Benjamin
In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. In defect inspection, conventional bright field techniques will not likely be

Frequency-agile, rapid scanning spectroscopy

April 28, 2013
Author(s)
Gar W. Truong, Kevin O. Douglass, Stephen E. Maxwell, Roger D. van Zee, David F. Plusquellic, Joseph T. Hodges, David A. Long
Challenging applications in trace gas analyses require high precision and acquisition rates.1-4 Many continuous-wave laser spectroscopy techniques exhibit significant sensitivity and potential;5 however, their scanning rates are slow because they rely upon

Writing Guidelines for Requests for Proposals for Automated Fingerprint Identification Systems

April 25, 2013
Author(s)
Susan M. Ballou, Michael Garris, Anthony Clay, Joi Dickerson, Peter T. Higgins, Janet Hoin, Lisa Jackson, Mike Lesko, Joe Morrissey, Leo Norton, Beth Owens, Joe Polski, Melissa Taylor
This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the

The Biological Evidence Preservation Handbook: Best Practices for Evidence Handlers

April 23, 2013
Author(s)
Susan M. Ballou, Margaret C. Kline, Mark D. Stolorow, Melissa Taylor, Shannan Williams, Phylis S. Bamberger, Burney Yvette, Larry Brown, Cynthia E. Jones, Ralph Keaton, William Kiley, Karen Thiessen, Gerry LaPorte, Joseph Latta, Linda E. Ledray, Randy Nagy, Linda Schwind, Stephanie Stoiloff, Brian Ostrom
The report of the Technical Working Group on Biological Evidence Preservation offers guidance for individuals involved in the collection, examination, tracking, packaging, storing, and disposition of biological evidence. This may include crime scene

Determining Mechanical Reliability of Brittle Materials

April 18, 2013
Author(s)
Stephen W. Freiman, Jeffrey Fong
The widespread existence of slow crack growth in most glasses and ceramics due to a stress-enhanced reaction between an external environment and strained bonds at a crack tip greatly complicates the challenge of assuring the reliability of components which

Estimating Uncertainties in Antenna Measurements

April 8, 2013
Author(s)
Michael H. Francis
We describe general methods of estimating uncertainties in antenna measurements. These include estimates based on theory (analysis1), simulation, and altering the measurement system (self-coparison tests). The important component sources of uncertainty in

Field Standards for Weights and Measures

April 1, 2013
Author(s)
Georgia L. Harris
An article written for the measurement community on whether [field] standards are “fit for purpose”. Is the equipment used is in testing designed for the purpose in which it is being used. The concept of fit for purpose is common in method validation

Path aggregation techniques for EXAFS visualization and analysis

April 1, 2013
Author(s)
Bruce Ravel
The path expansion model used by feff considers the EXAFS spectrum as the sum of contributions from scattering geometries of two or more atoms in a cluster surrounding the absorbing atom. This model and its representation as a collection of les is the

Performance Metrics of Speed and Separation Monitoring in Shared Workspaces

April 1, 2013
Author(s)
Jeremy A. Marvel
A metric is proposed that evaluates speed and separation monitoring efficacy in industrial robot environments in terms of the quantification of safety and the effects on productivity. The collision potential is rep-resented by separation metrics and sensor

Ground Truth Systems for Object Recognition and Tracking

March 29, 2013
Author(s)
Afzal A. Godil, Roger D. Eastman, Tsai H. Hong
In this report we discuss different types of ground-truth systems used for evaluation of object recognition and tracking systems in industrial manufacturing environments. We discuss three main ways for acquiring ground truth for object recognition and
Was this page helpful?