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PUBLICATIONS

Measurement and uncertainty analysis of a cryogenic low-noise amplifier with noise temperature below 2 K

Published

Author(s)

Dazhen Gu, James P. Randa, Robert L. Billinger, Dave K. Walker

Abstract

We report a record low noise temperature (NT) measured on a cryogenic low-noise amplifier (LNA) at the National Institute of Standards and Technology (NIST). The LNA exhibits about 44 dB gain and less than 2 K average NT in its operational band. Uncertainty analysis shows excellent measurement accuracy. The precision measurement technique at NIST is independent from the manufacturers' characterization method. This study marks the first time that such a low NT from a cryogenic LNA is verified independently with very small uncertainty.
Citation
Radio Science
Volume
48
Issue
3
Pub Type
Journals
Metrology

Citation

Gu, D. , Randa, J. , Billinger, R. and Walker, D. (2013), Measurement and uncertainty analysis of a cryogenic low-noise amplifier with noise temperature below 2 K, Radio Science (Accessed June 12, 2025)

Issues

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Created May 1, 2013, Updated January 27, 2020
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