NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Measurement and uncertainty analysis of a cryogenic low-noise amplifier with noise temperature below 2 K

Published

Author(s)

Dazhen Gu, James P. Randa, Robert L. Billinger, Dave K. Walker

Abstract

We report a record low noise temperature (NT) measured on a cryogenic low-noise amplifier (LNA) at the National Institute of Standards and Technology (NIST). The LNA exhibits about 44 dB gain and less than 2 K average NT in its operational band. Uncertainty analysis shows excellent measurement accuracy. The precision measurement technique at NIST is independent from the manufacturers' characterization method. This study marks the first time that such a low NT from a cryogenic LNA is verified independently with very small uncertainty.
Citation
Radio Science
Volume
48
Issue
3
Pub Type
Journals
Metrology

Citation

Gu, D. , Randa, J. , Billinger, R. and Walker, D. (2013), Measurement and uncertainty analysis of a cryogenic low-noise amplifier with noise temperature below 2 K, Radio Science (Accessed October 14, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created May 1, 2013, Updated January 27, 2020
Was this page helpful?