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Measurement and uncertainty analysis of a cryogenic low-noise amplifier with noise temperature below 2 K
Published
Author(s)
Dazhen Gu, James P. Randa, Robert L. Billinger, Dave K. Walker
Abstract
We report a record low noise temperature (NT) measured on a cryogenic low-noise amplifier (LNA) at the National Institute of Standards and Technology (NIST). The LNA exhibits about 44 dB gain and less than 2 K average NT in its operational band. Uncertainty analysis shows excellent measurement accuracy. The precision measurement technique at NIST is independent from the manufacturers' characterization method. This study marks the first time that such a low NT from a cryogenic LNA is verified independently with very small uncertainty.
Gu, D.
, Randa, J.
, Billinger, R.
and Walker, D.
(2013),
Measurement and uncertainty analysis of a cryogenic low-noise amplifier with noise temperature below 2 K, Radio Science
(Accessed May 29, 2023)