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Electronics

Semiconductors

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  • Published Date
Displaying 726 - 748 of 748

Noise Characterization of Multiport Amplifiers

October 1, 2001
Author(s)
James P. Randa
I address the issue of the definition and measurement of noise figure and parameters to characterize multiport devices, particularly differential amplifiers. A parameterization in terms of the noise matrix appears to be the most practical. the noise figure

Embedded Decoupling Capacitance Materials Characterization

December 1, 2000
Author(s)
Jan Obrzut
The dielectric constant of the embedded capacitance materials was measured in the frequency range from 100 Hz to 5 GHz. The testing included evaluation of the capacitance density, leakage current, and the effect of HAST on the capacitance. A test specimen

A Comparison of Aluminum Nitride Freely Nucleated and Seeded on 6H-Silicon Carbide

January 1, 2000
Author(s)
J H. Edgar, Larry Robins, S E. Coatney, L Liu, J Chaudhuri, K Ignatiev, Z J. Rek
The crystal structure and optical properties of AlN single crystals prepared by the sublimation-recondensation method were analyzed by cathodoluminescence (CL) spectroscopy, Raman spectroscopy, and synchrotron white-beam x-ray topography (SWBXT). Needles

On-Wafer Measurements of Noise Temperature

December 1, 1999
Author(s)
James P. Randa, Robert L. Billinger
The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on wafer. This report summarizes the theoretical formulation and describes the design, methods, and results of

Characterization and Applications of On-Wafer Diode Noise Sources

December 1, 1998
Author(s)
Lawrence P. Dunleavy, James P. Randa, Dave K. Walker, Robert L. Billinger, John Rice
A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.

Demineralizing Effect of Dental Cements on Human Dentin

November 1, 1998
Author(s)
Y Shimada, Y Kondo, S Inokoshi, J Tagami, Joseph M. Antonucci
This study was undertaken to verigy the hypothesis that dentin surfaces are demineralized during placement of four kinds of chemically setting cements (zinc phosphate cement, luting glass-ionomer cement, restorative glass-ionomer cement, and zinc

Characterization of On-Wafer Diode Noise Sources

June 1, 1998
Author(s)
James P. Randa, Dave K. Walker, Lawrence P. Dunleavy, Robert L. Billinger, John Rice
A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on-wafer

Interconnection Continuity Test for Packaged Functional Modules

March 3, 1998
Author(s)
Jan Obrzut
We developed an electrical test to evaluate interconnections in packaged, electrostatic-discharge (ESD) protected modules. The ESD protection circuit, which in modern integrated circuits is present at every I/O as an inherent part of the chip structure

Quantum Fluctuations and the Single Junction Coulomb Blockade

January 1, 1990
Author(s)
S Girvin, L Glazman, M Jonson, David R. Penn, Mark D. Stiles
We investigate the effect of quantum flucuations on the Coulomb blockade in a single tunnel junction coupled to its environment by a transmission line of arbitrary impedance Z (ω). The quantized oscillating modes of the transmission line are suddenly
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