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International Comparison of Surface Roughness, APMP.L-K8

Author(s)
Andrew Baker, Siew-Leng Tan, Richard Leach, Lena Jung, Seung Yin Wong, Anusorn Tonmueanwai, Kazuya Naoi, Jaewan Kim, Thomas Brian Renegar, K P Chaudhary, Louise Mostert, Mohamed Amer, Sitian Gao, Chin-Lung Tsai, Ngo N. Anh, Augustinus Drijarkara
Surface roughness calibration services of sixteen countries from four metrology regions are compared through measurements of roughness and step height standards...

Field Standards for Weights and Measures

Author(s)
Georgia L. Harris
An article written for the measurement community on whether [field] standards are “fit for purpose”. Is the equipment used is in testing designed for the...

Refrigerant Properties for Heat Transfer Analysis

Author(s)
Mark O. McLinden
Presentation at 2013 Winter Annual Meeting of the American Society of Heating, Refrigerating and Air-Conditioning Engineers (ASHRAE), Dallas, Texas, January 27...

Building Quantum Computers

Author(s)
Emanuel H. Knill
Abstract: In theory, quantum computers can be used to efficiently factor numbers, quadratically speed up many search and optimization problems, and enable...

Training Excellence: What Does Success Look Like?

Author(s)
Carol T. Hockert, Georgia L. Harris
The National Institute of Standards, Office of Weights and Measures has been working the last few years toward compliance with several educational standards in...

Power Density Rating for Embedded Resistors

Author(s)
Jan Obrzut, Jason D. Ferguson, MIchael H. Azarian
The Power Density Ratting (PDR) for Embedded Resistors test method covers procedures for the demonstration of the ability to operate the embedded device safely...
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