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PUBLICATIONS

Software for Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields*

Published

Author(s)

Nathan D. Orloff, Jan Obrzut, Christian J. Long, Thomas F. Lam, Pavel Kabos, David R. Novotny, James C. Booth, James A. Liddle

Abstract

This software package was developed to analyze microwave cavity perturbation data in order to determine material dielectric properties. Example software is provided to assist with data acquisition and organization. Specifically, it is de-signed to be used when measurements of the cavity response are made as a function of the degree of sample insertion into a microwave cavity.
Citation
Matlab Central
Volume
62
Issue
9
Pub Weblink
http://www.mathworks.com/matlabcentral/fileexchange/
Pub Type
Websites

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Keywords

microwave cavity, software
Metrology

Citation

Orloff, N. , Obrzut, J. , Long, C. , Lam, T. , Kabos, P. , Novotny, D. , Booth, J. and Liddle, J. (2014), Software for Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields*, Matlab Central, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916077, http://www.mathworks.com/matlabcentral/fileexchange/ (Accessed December 11, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 1, 2014, Updated April 15, 2019