Software for Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields*
Nathan D. Orloff, Jan Obrzut, Christian J. Long, Thomas F. Lam, Pavel Kabos, David R. Novotny, James C. Booth, James A. Liddle
This software package was developed to analyze microwave cavity perturbation data in order to determine material dielectric properties. Example software is provided to assist with data acquisition and organization. Specifically, it is de-signed to be used when measurements of the cavity response are made as a function of the degree of sample insertion into a microwave cavity.