U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Journals

Magnetic Depth Profiling Co/Cu Multilayers to Investigate Magnetoresistance

Author(s)
John Unguris, D Tulchinsky, Michael H. Kelley, Julie A. Borchers, Joseph A. Dura, Charles F. Majkrzak, S. Y. Hsu, R Loloee, W Pratt, J Bass
The magnetic microstructure responsible for the metastable high resistance state of weakly coupled, as-prepared [Co(6nm)/Cu(6nm)] 20 multilayer was analyzed...

A=B?

Author(s)
Isabel M. Beichl, F Sullivan
In this prescription we'll describe one technique for working with extremely large integers having perhaps thousands of digits, using only standard hardware and...

Magnetism and Incommensurate Waves in Zr3(Rh1-xPdx)4

Author(s)
Lawrence H. Bennett, Richard M. Waterstrat, L Swartzendruber, Leonid A. Bendersky, H J. Brown, R E. Watson
The unusual properties of the Zr 3(Rh 1-xPd x) 4 alloy system are reported here. Contrary to most metallically bonded systems, which are not quick to change...

Absolute Magnetic Moment Measurements of Nickel Spheres

Author(s)
Robert D. Shull, Robert D. McMichael, L Swartzendruber, Stefan D. Leigh
The preparation and measurement of nickel spheres for use in the calibration of magnetometers are described. The absolute value of the magnetic moment of a set...

Non-Arrhenius Temperature Dependence of Magnetic After Effect

Author(s)
L Swartzendruber, P Rugkwamsook, Lawrence H. Bennett, Edward Della Torre
The rate of magnetization change (magnetic aftereffect) which occurs after the magnetic field applied to a magnetic material is switched suddenly to a new value...

Tomography of Integrated Circuit Interconnect With an Electromigration Void

Author(s)
Zachary H. Levine, A R. Kalukin, M Kuhn, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Uwe Arp, Thomas B. Lucatorto, Bruce D. Ravel, Charles S. Tarrio
An integrated circuit interconnect was subject to accelerated-life conditions to induce an electromigration void. The silicon substrate was removed, leaving...

Infrared Spectral Responsivity Scale of NIST

Author(s)
George P. Eppeldauer, Alan L. Migdall
An ambient temperature Infrared Spectral Responsivity Comparator Facility has been developed at NIST to calibrate infrared detectorsand radiometers for spectral...

Thermodynamic Properties of Sulfur Hexafluoride

Author(s)
John J. Hurly, Dana R. Defibaugh, Michael R. Moldover
We present new vapor phase speed-of-sound data u(P,T), new Burnett density-pressure-temperature data ρ(P,T), and a few vapor pressure measurements for sulfur...

Maintaining the Accuracy of Charpy Impact Machines

Author(s)
D P. Vigliotti, Thomas A. Siewert, Christopher N. McCowan
The quality of the data developed by impact machines tends to degrade over time, due to the effects of weear and vibration that are inherent in the test. This...

Magneto-Optical Trapping of Chromium Atoms

Author(s)
C Bradley, Jabez J. McClelland, W Anderson, Robert Celotta
We have constructed a magneto-optical trap for chromium atoms. Using trapping light at 425 nm and two repumping lasers tuned to intercombination transitions...
Was this page helpful?